Asylum Research AFM/SPM Products

MFP-3D™ Stand Alone Atomic Force Microscope

Power and Flexibility in One Complete System

The Atomic Force Microscope (AFM), has been the instrument of choice for three dimensional measurements at the nanometer scale. With the MFP-3D Stand Alone (MFP-3D-SA) AFM, scientists can now choose a sensitive and precise AFM with the lowest noise performance that also includes a complete scientific software environment. The MFP-3D-SA is ideal for many applications including physics, material science, polymers, chemistry, nanolithography, bioscience, and quantitative nanoscale measurements. The MFP-3D has the flexibility to acquire your data, analyze it, and even make publication-ready graphics. Your imagination is your only limit.

Technical Innovations

1. Designed with sensored, closed loop positioning to give image clarity, accuracy, and reproducibility.

2. Designed with an all-digital controller and open software adaptability to meet the demands of your research.

3. Designed with advanced features built-in such as nanolithography and 3D rendering.

4. Exclusive Dual AC Mode™. In Dual AC Mode, the cantilever is driven at or near two of its resonant vibrational modes or frequencies. The amplitude and phase signals for these two modes show striking contrast on a variety of samples.

Zoom and offset.

MFP-3D Head
Low noise, eliminates interference

Sensored optical lever with diffraction limited optics and a low coherence light source virtually eliminates interference artifacts. The NPS™ sensored Z axis provides precise measurements of the cantilever position for accurate force and topography measurements. An optional Extended Head allows for a 40µm Z range.

MFP-3D XY Scanner
Precision and accuracy unlike any tube scanner

The MFP-3D uses a flexured scanner and patent-pending NPS Nanopositioning sensors which measure the exact position of each axis (X & Y). They correct for hysteresis and creep, providing flat scans and the ability to accurately zoom and offset with one mouse click.

MFP-3D Base
Three configurations for illuminating
and viewing your sample.

Top view for opaque samples.
Bottom view for transparent samples.
Dual view for both viewing options.

All-Digital Controller and Software
All-digital configuration allows virtually the entire system operation to be controlled through the MFP software interface (IGOR Pro) for easy addition of new microscope capabilities.

• 100% digital for low noise, fast operation, and flexibility

• Field Programmable Gate Array (FPGA) and Digital Signal Processor (DSP)

• Fast analog-to-digital/digital-to-analog conversions

What Kind of User Are You?	Built-in Features
New	ModeMaster™ - A library of standard and user-defined operation modes such as AC, Contact, Phase, EFM, LFM, Force Mode, Nanolithography Savant™ - Turns complex tasks into a single mouse click SmartStart™ - Auto configures any peripheral that interfaces with the controller for plug and play operation 25+ megapixel resolution
Experienced	MicroAngelo™ - Nanolithography and manipulation ARgyle™ - 3D rendering both on and offline Channel Overlay – Overlay data such as EFM or phase channel on topography
Power	IGOR Command and macro language at your disposal DSPDirector™ allows direct access to the DSP for custom experiments (optional) Edit and create your own Savant routines Software control of signal routing through crosspoint switch

Applications

Material Science

1µm x 1µm phase image
of pits etched in silicon
through the self-assembled, diblock, polymer mask.
Sample courtesy of O. Gang, Brookhaven National Laboratory.

Devices

MFM image of a hard disk, 20µm scan.

Life Science

Live endothelial cell,
90µm scan.

Lithography

Nanografting of thiols
on a Au(111) surface.
1.5µm scan courtesy
of M. Liu and G. Liu,
UC Davis.

Asylum Research – Science First
Asylum Research was founded by scientists with the simple goal of creating the world’s best research instrumentation for other scientists. Whether your applications are in materials science, life science, polymers, nanolithography, electrical or magnetic measurements, Asylum Research has raised the bar for Atomic Force Microscope (AFM) performance

Personalized, Exceptional Support
Once you begin your research, our staff scientists are here to help you get the most out of your MFP-3D. We extend this personalized support by being virtually in your lab with “OnSight” – a remote support system that lets us view, diagnose and control your system over the Internet. Our easy, secure, web-based system enables shared screen, mouse and keyboard control of your AFM, making it ideal for training and troubleshooting.

Take the Asylum Challenge
We challenge you to look at our AFM back to back with any other in the world. If for any reason you are not satisfied within the first six months of ownership, we will refund your money. Call us today to schedule a demo to see why your next AFM should be an MFP-3D.

For the full text brochure and detailed specifications, download the PDF copy of the MFP-3D-SA brochure.

Asylum Research • 6310 Hollister Ave. • Santa Barbara, CA 93117 • 888-472-2795 • 805-696-6466 voice • 805-696-6444 fax • info@AsylumResearch.com