Asylum Research

 

Calibration Standards and Samples

Listed below are the model numbers and descriptions of our calibration standards and imaging samples.

 

Model Type
Price
900.307 VLSI CALIBRATION GRATING - UNMOUNTED 8 mm x 8 mm die, nominal 10 µm X and Y pitch pattern, nominal 180 nm Z height, conformally coated with platinum. out ot stock
900.308 VLSI CALIBRATION GRATING - GLASS SLIDE MOUNTED 8 mm x 8 mm die, nominal 10 µm X and Y pitch pattern, nominal 180 nm Z height, conformally coated with platinum. out ot stock
900.309 VLSI CALIBRATION GRATING - STEEL PUCK MOUNTED MOUNTED 8 mm x 8 mm die, nominal 10 µm X and Y pitch pattern, nominal 180 nm Z height, conformally coated with platinum. out ot stock
900.237 Asylum Research CalibratAR 3D Calibration Reference for X, Y and Z calibration of the scanning mechanism. 10mmx10mm Si die, 0.5mm thick containing two pitch and step-height gratings. Mounted on 15mm diameter steel puck. $500
900.238 Asylum Research CalibratAR 3D Calibration Reference for X, Y and Z calibration of the scanning mechanism. 10mmx10mm Si die, 0.5mm thick containing two pitch and step-height gratings. Mounted on 3" x1" glass slide. $500
900.239 Asylum Research CalibratAR 3D Calibration Reference for X, Y and Z calibration of the scanning mechanism. 10mmx10mm Si die, 0.5mm thick containing two pitch and step-height gratings. Unmounted. $400
2D100 Nanosensors Calibration Standard for the x-y calibration of the scanning mechanism, lattice of inverted pyramids, 100nm pitch. $1,600
2D200 Nanosensors Calibration Standard for the x-y calibration of the scanning mechanism, lattice of inverted pyramids, 200nm pitch. $1,000
2D300 Nanosensors Calibration Standard for the x-y calibration of the scanning mechanism, lattice of inverted pyramids, 300nm pitch. $1,000
FLAT Nanosensors Flatness Standard for analysis and correction of the scanner bow, smooth plane with a maximum peak to valley distance of 10nm on a 100x100µm2 area. $800
H8 Nanosensors Height Standard for very precise z-calibration, nominal step height 8nm. $1,600
Model Type
Price
900.241 The AR-PPLN Test Sample is a convenient and reliable sample for practice, setup, and verification for a wide variety of Piezoresponse Force Microscopy (PFM) techniques. Mounted on a 15mm diameter steel puck. $350
900.242 The AR-PPLN Test Sample is a convenient and reliable sample for practice, setup, and verification for a wide variety of Piezoresponse Force Microscopy (PFM) techniques. Mounted on a 3" x 1" microscope slide. $350
900.243 The AR-PPLN Test Sample is a convenient and reliable sample for practice, setup, and verification for a wide variety of Piezoresponse Force Microscopy (PFM) techniques. Unmounted. $300
SEBS KRATONTM G-1652 thermoplastic rubber triblock copolymer with polystyrene end blocks and a rubbery poly(ethylene-butylene) mid block. with a monolayer to two layers thick (between 28nm and 50nm). Samples are all spin cast and annealed. $200
Application Kits Specialized kits that contain a variety of items (such as samples and cantilevers) for application-specific imaging such as phase imaging, spring constant calibration and DNA imaging and force measurements.
Gold Slides A variety of continuously coated or patterned gold substrates including glass or mica microscope slides

 


Oxford Instruments Asylum Research, Inc. • 6310 Hollister Ave. • Santa Barbara, CA  93117 • +1-805-696-6466AFM.info@oxinst.com