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| Probe List sorted by: TYPE |
| AC MODE (AIR) | AC MODE (FLUID) | |
| AC MODE SOFT (AIR) | CONTACT MODE | |
| DIAMOND COATED | ELECTRIC FORCE | |
| HIGH ASPECT RATIO | LATERAL FORCE | |
| MAGNETIC FORCE | SUPER SHARP | |
| TIPLESS | ULTRA-SMALL | |
| iDrive ACTUATED | ||
| NOTE: AC Mode is equivalent to Tapping/Non-Contact Mode. | ||
| AC MODE (AIR) | k (N/m) | f0 (kHz) | Description/Applications | Manufacturer |
| AC160TS | 42 | 300 | Silicon probe; Al reflex coated Veeco model - OTESPA General samples |
Olympus |
| AC55TS | 85 | 1600 | NEW Silicon probe; Au reflex coated Fast imaging; General samples |
Olympus |
| ATEC-NC | 45 | 335 | Silicon probe; tip visible at end of lever General samples |
Nanosensors |
| ATEC-NCAu | 45 | 335 | Silicon probe; tip visible at end of lever; Au reflex/tip coated General samples; Tip functionalization; Force measurements |
Nanosensors |
| Arrow NC | 42 | 285 | Silicon probe; arrow shaped General samples |
NanoWorld |
| Arrow NCR | 42 | 285 | Silicon probe; arrow shaped; Al reflex coated General samples |
NanoWorld |
| HA100WS | 15 | 160 | Nitride probe; low wear; twin tip Tip degrading samples |
Olympus |
| NCH | 42 | 320 | Silicon probe Veeco model - TESP General samples |
NanoWorld |
| NCHR | 42 | 320 | Silicon probe; Al reflex coated Veeco model - TESPA General samples |
NanoWorld |
| NCL | 48 | 190 | Silicon probe Veeco model - LTESP General samples |
NanoWorld |
| NCLR | 48 | 190 | Silicon probe; Al reflex coated General samples |
NanoWorld |
| PL2-NCH | 42 | 330 | Silicon probe; 1.8um diameter & 2um tall plateau tip Large features; Step heights |
Nanosensors |
| PL2-NCHR | 42 | 330 | Silicon probe; 1.8um diameter & 2um tall plateau tip; Al reflex coated Large features; Step heights |
Nanosensors |
| PL2-NCL | 48 | 190 | Silicon probe; 1.8um diameter & 2um tall plateau tip Large features; Step heights |
Nanosensors |
| PL2-NCLR | 48 | 190 | Silicon probe; 1.8um diameter & 2um tall plateau tip; Al reflex coated Large features; Step heights |
Nanosensors |
| PPP-NCH | 42 | 330 | Silicon probe Veeco model - TESP General samples |
Nanosensors |
| PPP-NCHAu | 42 | 330 | Silicon probe; Au reflex/tip coated General samples; Tip functionalization; Force measurements |
Nanosensors |
| PPP-NCHAuD | 42 | 330 | Silicon probe; Au reflex coated General samples |
Nanosensors |
| PPP-NCHR | 42 | 330 | Silicon probe; Al reflex coated Veeco model - TESPA General samples |
Nanosensors |
| PPP-NCL | 48 | 190 | Silicon probe Veeco model - LTESP General samples |
Nanosensors |
| PPP-NCLAu | 48 | 190 | Silicon probe; Au reflex/tip coated General samples; Tip functionalization; Force measurements |
Nanosensors |
| PPP-NCLAuD | 48 | 190 | Silicon probe; Au reflex coated General samples |
Nanosensors |
| PPP-NCLR | 48 | 190 | Silicon probe; Al reflex coated General samples |
Nanosensors |
| PPP-QNCHR | 42 | 330 | Silicon probe; Q factor = 30k - 50k in UHV; Al reflex coated Vacuum imaging |
Nanosensors |
| PPP-RT-NCHR | 42 | 330 | Silicon probe; 180deg tip rotation; Al reflex coated Veeco equiv - RTESPA General samples |
Nanosensors |
| PPP-SEIH | 15 | 130 | Silicon probe General samples |
Nanosensors |
| PPP-SEIHR | 15 | 130 | Silicon probe; Al reflex coated General samples |
Nanosensors |
| PPP-XYNCHR | 42 | 330 | Silicon probe; XY auto-align; Al reflex coated Veeco model - TESPA General samples |
Nanosensors |
| SEIHR | 15 | 130 | Silicon probe General samples |
NanoWorld |
| USC-EBD-5.0 | 30 | 3600 | NEW Carbon EBD tip on silicon lever; Au reflex coated Fast imaging; Atomic resolution |
Nanotools |
| AC MODE (FLUID) | k (N/m) | f0 (kHz) | Description/Applications | Manufacturer |
| AC10DS | 0.1 | 1500 | NEW BioLever Fast Nitride probe; Au reflex coated Fast imaging; Bio samples; Soft samples |
Olympus |
| Arrow UHFAuD | 6 | 850 | NEW Silicon probe; arrow shaped; Au reflex coated Atomic resolution |
NanoWorld |
| BL-AC40TS | 0.25 | 130 | BioLever Mini Silicon tip on nitride lever; low noise; Au reflex coated Bio samples; Soft samples |
Olympus |
| BL-RC-150VB | 0.03 0.03 0.006 0.006 |
37 37 13 13 |
BioLever Nitride probe; 2 sets of 2 levers; low noise; Au reflex/tip coated Veeco model - OBL Force measurements; Bio samples; Soft samples; Tip functionalization |
Olympus |
| BL-TR400PB | 0.09 0.02 |
32 10 |
iDrive-N01 Nitride probe; Au reflex/tip coated Bio samples; Soft samples |
Asylum |
| BL-TR800PB | 0.61 0.16 |
68 22 |
iDrive-N02 Nitride probe; Au reflex/tip coated General samples; Soft samples |
Asylum |
| PNP-DB | 0.48 0.06 |
67 17 |
Nitride probe; 2 levers; Au reflex coated General samples; LFM; Force measurements |
NanoWorld |
| PNP-TR | 0.32 0.08 |
67 17 |
Nitride probe; 2 levers; Au reflex coated Veeco equiv - DNP-S Bio samples; Soft samples; Force measurements |
NanoWorld |
| RC800PB | 0.42 0.06 0.82 0.11 |
64 17 66 17 |
Nitride probe; 4 levers; Au reflex/tip coated General samples; Tip functionalization; Force measurements |
Olympus |
| RC800PSA | 0.39 0.05 0.76 0.10 |
69 18 71 19 |
Nitride probe; 4 levers; Au reflex coated Veeco model - ORC8 General samples; LFM; Force measurements |
Olympus |
| TR400PB | 0.09 0.02 |
32 10 |
Nitride probe; 2 sets of 2 levers; Au reflex/tip coated Bio samples; Tip functionalization; Force measurements |
Olympus |
| TR400PSA | 0.08 0.02 |
34 11 |
Nitride probe; 2 sets of 2 levers; Au reflex coated Veeco model - OTR4 Bio samples; Soft samples; Force measurements |
Olympus |
| TR800PB | 0.61 0.16 |
68 22 |
Nitride probe; 2 sets of 2 levers; Au reflex/tip coated General samples; Tip functionalization; Force measurements |
Olympus |
| TR800PSA | 0.57 0.15 |
73 24 |
Nitride probe; 2 sets of 2 levers; Au reflex coated Veeco model - OTR8 General samples; Soft samples; Force measurements |
Olympus |
| USC-EBD-2.0 | 3 | 1200 | NEW Carbon EBD tip on silicon lever; Au reflex coated Fast imaging; Atomic resolution |
Nanotools |
| USC-EBD-5.0 | 30 | 3600 | NEW Carbon EBD tip on silicon lever; Au reflex coated Fast imaging; Atomic resolution |
Nanotools |
| AC MODE SOFT (AIR) | k (N/m) | f0 (kHz) | Description/Applications | Manufacturer |
| AC200TS | 9.7 | 115 | Silicon probe; Al reflex coated General samples |
Olympus |
| AC240TS | 2 | 70 | Silicon probe; Al reflex coated Veeco model - OLTESPA General samples |
Olympus |
| ATEC-FM | 2.8 | 85 | Silicon probe; tip visible at end of lever General samples |
Nanosensors |
| ATEC-FMAu | 2.8 | 85 | Silicon probe; tip visible at end of lever; Au reflex/tip coated General samples; Tip functionalization; Force measurements |
Nanosensors |
| Arrow FM | 2.8 | 75 | Silicon probe; arrow shaped General samples |
NanoWorld |
| Arrow FMR | 2.8 | 75 | Silicon probe; arrow shaped; Al reflex coated General samples |
NanoWorld |
| Arrow UHF | 6 | 850 | Silicon probe; arrow shaped; Al reflex coated Fast imaging |
NanoWorld |
| FM | 2.8 | 75 | Silicon probe Veeco model - FESP General samples |
NanoWorld |
| FMR | 2.8 | 75 | Silicon probe; Al reflex coated General samples |
NanoWorld |
| NCST | 7.4 | 160 | Silicon probe General samples |
NanoWorld |
| NCSTR | 7.4 | 160 | Silicon probe; Al reflex coated General samples |
NanoWorld |
| PL2-FM | 2.8 | 75 | Silicon probe; 1.8um diameter & 2um tall plateau tip Large features; Step heights |
Nanosensors |
| PL2-FMR | 2.8 | 75 | Silicon probe; 1.8um diameter & 2um tall plateau tip; Al reflex coated Large features; Step heights |
Nanosensors |
| PPP-FM | 2.8 | 75 | Silicon probe Veeco model - FESP General samples |
Nanosensors |
| PPP-FMAu | 2.8 | 75 | Silicon probe; Au reflex/tip coated General samples; Tip functionalization; Force measurements |
Nanosensors |
| PPP-FMAuD | 2.8 | 75 | Silicon probe; Au reflex coated General samples |
Nanosensors |
| PPP-FMR | 2.8 | 75 | Silicon probe; Al reflex coated General samples |
Nanosensors |
| PPP-NCST | 7.4 | 160 | Silicon probe General samples |
Nanosensors |
| PPP-NCSTAu | 7.4 | 160 | Silicon probe; Au reflex/tip coated General samples; Tip functionalization; Force measurements |
Nanosensors |
| PPP-NCSTAuD | 7.4 | 160 | Silicon probe; Au reflex coated General samples |
Nanosensors |
| PPP-NCSTR | 7.4 | 160 | Silicon probe; Al reflex coated General samples |
Nanosensors |
| PPP-QFMR | 2.8 | 75 | Silicon probe; Q factor = 30k - 50k in UHV; Al reflex coated Vacuum imaging |
Nanosensors |
| PPP-RT-FMR | 2.8 | 75 | Silicon probe; 180deg tip rotation; Al reflex coated General samples |
Nanosensors |
| PPP-XYNCSTR | 7.4 | 160 | Silicon probe; XY auto-align; Al reflex coated General samples |
Nanosensors |
| USC-EBD-2.0 | 3 | 1200 | NEW Carbon EBD tip on silicon lever; Au reflex coated Fast imaging; Atomic resolution |
Nanotools |
| CONTACT MODE | k (N/m) | f0 (kHz) | Description/Applications | Manufacturer |
| ATEC-CONT | 0.2 | 15 | Silicon probe; tip visible at end of lever General samples |
Nanosensors |
| ATEC-CONTAu | 0.2 | 15 | Silicon probe; tip visible at end of lever; Au reflex/tip coated General samples; Tip functionalization; Force measurements |
Nanosensors |
| Arrow CONT | 0.2 | 14 | Silicon probe; arrow shaped General samples |
NanoWorld |
| Arrow CONTR | 0.2 | 14 | Silicon probe; arrow shaped; Al reflex coated General samples |
NanoWorld |
| BL-RC-150VB | 0.03 0.03 0.006 0.006 |
37 37 13 13 |
BioLever Nitride probe; 2 sets of 2 levers; low noise; Au reflex/tip coated Veeco model - OBL Force measurements; Bio samples; Soft samples; Tip functionalization |
Olympus |
| CONT | 0.2 | 13 | Silicon probe General samples |
NanoWorld |
| CONTR | 0.2 | 13 | Silicon probe; Al reflex coated Veeco model - ESP General samples |
NanoWorld |
| CONTSC | 0.2 | 23 | Silicon probe General samples |
NanoWorld |
| CONTSCR | 0.2 | 23 | Silicon probe; Al reflex coated General samples |
NanoWorld |
| PL2-CONT | 0.2 | 13 | Silicon probe; 1.8um diameter & 2um tall plateau tip Large features; Step heights |
Nanosensors |
| PL2-CONTR | 0.2 | 13 | Silicon probe; 1.8um diameter & 2um tall plateau tip; Al reflex coated Large features; Step heights |
Nanosensors |
| PNP-DB | 0.48 0.06 |
67 17 |
Nitride probe; 2 levers; Au reflex coated General samples; LFM; Force measurements |
NanoWorld |
| PNP-TR | 0.32 0.08 |
67 17 |
Nitride probe; 2 levers; Au reflex coated Veeco equiv - DNP-S Bio samples; Soft samples; Force measurements |
NanoWorld |
| PPP-CONT | 0.2 | 13 | Silicon probe General samples |
Nanosensors |
| PPP-CONTAu | 0.2 | 13 | Silicon probe; Au reflex/tip coated General samples; Tip functionalization; Force measurements |
Nanosensors |
| PPP-CONTAuD | 0.2 | 13 | Silicon probe; Au reflex coated General samples |
Nanosensors |
| PPP-CONTR | 0.2 | 13 | Silicon probe; Al reflex coated Veeco model - ESP General samples |
Nanosensors |
| PPP-CONTSC | 0.2 | 23 | Silicon probe General samples |
Nanosensors |
| PPP-CONTSCAu | 0.2 | 23 | Silicon probe; Au reflex/tip coated General samples; Tip functionalization; Force measurements |
Nanosensors |
| PPP-CONTSCAuD | 0.2 | 23 | Silicon probe; Au reflex coated General samples |
Nanosensors |
| PPP-CONTSCR | 0.2 | 23 | Silicon probe; Al reflex coated General samples |
Nanosensors |
| PPP-RT-CONTR | 0.2 | 13 | Silicon probe; 180deg tip rotation; Al reflex coated General samples |
Nanosensors |
| PPP-XYCONTR | 0.2 | 13 | Silicon probe; XY auto-align; Al reflex coated Veeco model - ESP General samples |
Nanosensors |
| PPP-ZEILR | 1.6 | 27 | Silicon probe; Al reflex coated General samples |
Nanosensors |
| RC800PB | 0.42 0.06 0.82 0.11 |
64 17 66 17 |
Nitride probe; 4 levers; Au reflex/tip coated General samples; Tip functionalization; Force measurements |
Olympus |
| RC800PSA | 0.39 0.05 0.76 0.10 |
69 18 71 19 |
Nitride probe; 4 levers; Au reflex coated Veeco model - ORC8 General samples; LFM; Force measurements |
Olympus |
| TR400PB | 0.09 0.02 |
32 10 |
Nitride probe; 2 sets of 2 levers; Au reflex/tip coated Bio samples; Tip functionalization; Force measurements |
Olympus |
| TR400PSA | 0.08 0.02 |
34 11 |
Nitride probe; 2 sets of 2 levers; Au reflex coated Veeco model - OTR4 Bio samples; Soft samples; Force measurements |
Olympus |
| TR800PB | 0.61 0.16 |
68 22 |
Nitride probe; 2 sets of 2 levers; Au reflex/tip coated General samples; Tip functionalization; Force measurements |
Olympus |
| TR800PSA | 0.57 0.15 |
73 24 |
Nitride probe; 2 sets of 2 levers; Au reflex coated Veeco model - OTR8 General samples; Soft samples; Force measurements |
Olympus |
| USC-EBD-0.3 | 0.3 | 180 | NEW Carbon EBD tip on silicon lever; Au reflex coated Fast imaging |
Nanotools |
| ZEILR | 1.6 | 27 | Silicon probe; Al reflex coated General samples |
NanoWorld |
| DIAMOND COATED | k (N/m) | f0 (kHz) | Description/Applications | Manufacturer |
| CDT-CONTR | 0.2 | 13 | Silicon probe; conductive diamond coated tip; Al reflex coated CAFM; SCM |
Nanosensors |
| CDT-FMR | 2.8 | 75 | Silicon probe; conductive diamond coated tip; Al reflex coated Veeco model - DDESP-FM CAFM; SCM |
Nanosensors |
| CDT-FMR | 2.8 | 75 | Silicon probe; conductive diamond coated tip; Al reflex coated Veeco model - DDESP-FM CAFM; SCM |
NanoWorld |
| CDT-NCHR | 42 | 330 | Silicon probe; conductive diamond coated tip; Al reflex coated Veeco model - DDESP SSRM; CAFM; SCM |
Nanosensors |
| CDT-NCHR | 42 | 320 | Silicon probe; conductive diamond coated tip; Al reflex coated Veeco model - DDESP SSRM; CAFM; SCM |
NanoWorld |
| CDT-NCLR | 48 | 190 | Silicon probe; conductive diamond coated tip; Al reflex coated SSRM; CAFM; SCM |
Nanosensors |
| CDT-NCLR | 48 | 190 | Silicon probe; conductive diamond coated tip; Al reflex coated SSRM; CAFM; SCM |
NanoWorld |
| DT-CONTR | 0.2 | 13 | Silicon probe; diamond coated tip; Al reflex coated Tip degrading samples |
Nanosensors |
| DT-FMR | 2.8 | 75 | Silicon probe; diamond coated tip; Al reflex coated Tip degrading samples |
Nanosensors |
| DT-FMR | 2.8 | 75 | Silicon probe; diamond coated tip; Al reflex coated Tip degrading samples |
NanoWorld |
| DT-NCHR | 42 | 330 | Silicon probe; diamond coated tip; Al reflex coated Veeco equiv - TESPD Tip degrading samples |
Nanosensors |
| DT-NCHR | 42 | 320 | Silicon probe; diamond coated tip; Al reflex coated Veeco equiv - TESPD Tip degrading samples |
NanoWorld |
| DT-NCLR | 48 | 190 | Silicon probe; diamond coated tip; Al reflex coated Tip degrading samples |
Nanosensors |
| DT-NCLR | 48 | 190 | Silicon probe; diamond coated tip; Al reflex coated Tip degrading samples |
NanoWorld |
| ELECTRIC FORCE | k (N/m) | f0 (kHz) | Description/Applications | Manufacturer |
| AC240TM | 2 | 70 | ElectriLever Silicon probe; Al reflex coated; Pt coated tip Veeco model - OSCM-PT CAFM; EFM, KPFM; SCM; PFM |
Olympus |
| ASYELEC-01 | 2 | 70 | Silicon probe; Ir reflex/tip coated CAFM; EFM, KPFM; SCM; PFM |
Asylum |
| ATEC-CONTPt | 0.2 | 15 | Silicon probe; tip visible at end of lever; PtIr reflex/tip coated CAFM; EFM, KPFM; SCM |
Nanosensors |
| ATEC-EFM | 2.8 | 85 | Silicon probe; tip visible at end of lever; PtIr reflex/tip coated CAFM; EFM, KPFM; SCM; PFM |
Nanosensors |
| ATEC-NCPt | 45 | 335 | Silicon probe; tip visible at end of lever; PtIr reflex/tip coated CAFM; PFM |
Nanosensors |
| Arrow CONTPt | 0.2 | 14 | Silicon probe; arrow shaped; PtIr reflex/tip coated CAFM; EFM, KPFM; SCM |
NanoWorld |
| Arrow EFM | 2.8 | 75 | Silicon probe; arrow shaped; PtIr reflex/tip coated CAFM; EFM, KPFM; SCM; PFM |
NanoWorld |
| Arrow NCPt | 42 | 285 | Silicon probe; arrow shaped; PtIr reflex/tip coated CAFM; PFM |
NanoWorld |
| CONTPt | 0.2 | 13 | Silicon probe; PtIr reflex/tip coated Veeco model - SCM-PIC CAFM; EFM, KPFM; SCM |
NanoWorld |
| EFM | 2.8 | 75 | Silicon probe; PtIr reflex/tip coated Veeco model - SCM-PIT CAFM; EFM, KPFM; SCM; PFM |
NanoWorld |
| NCHPt | 42 | 320 | Silicon probe; PtIr reflex/tip coated CAFM; PFM |
NanoWorld |
| NCLPt | 48 | 190 | Silicon probe; PtIr reflex/tip coated CAFM; PFM |
NanoWorld |
| PPP-CONTPt | 0.2 | 13 | Silicon probe; PtIr reflex/tip coated Veeco model - SCM-PIC CAFM; EFM, KPFM; SCM |
Nanosensors |
| PPP-CONTSCPt | 0.2 | 23 | Silicon probe; PtIr reflex/tip coated CAFM; EFM, KPFM; SCM |
Nanosensors |
| PPP-EFM | 2.8 | 75 | Silicon probe; PtIr reflex/tip coated Veeco model - SCM-PIT CAFM; EFM, KPFM; SCM; PFM |
Nanosensors |
| PPP-NCHPt | 42 | 330 | Silicon probe; PtIr reflex/tip coated CAFM; PFM |
Nanosensors |
| PPP-NCLPt | 48 | 190 | Silicon probe; PtIr reflex/tip coated CAFM; PFM |
Nanosensors |
| PPP-NCSTPt | 7.4 | 160 | Silicon probe; PtIr reflex/tip coated CAFM; EFM, KPFM; SCM; PFM |
Nanosensors |
| HIGH ASPECT RATIO | k (N/m) | f0 (kHz) | Description/Applications | Manufacturer |
| AC160BN | 42 | 300 | Silicon probe; tip aspect ratio >= 5:1; Al reflex coated Steep sidewalls |
Olympus |
| AC160FS | 42 | 300 | Silicon lever; amorphous carbon EBD tip > 0.2um tall; 4:1 aspect ratio; tip tilt = 12deg; Al reflex coated Steep sidewalls |
Olympus |
| AC240FS | 2 | 70 | Silicon lever; amorphous carbon EBD tip > 0.2um tall; 4:1 aspect ratio; tip tilt = 12deg; Al reflex coated Steep sidewalls |
Olympus |
| AR10-NCH | 42 | 330 | Silicon probe; tip aspect ratio >= 10:1 Very steep sidewalls |
Nanosensors |
| AR10-NCHR | 42 | 330 | Silicon probe; tip aspect ratio >= 10:1; Al reflex coated Very steep sidewalls |
Nanosensors |
| AR10-NCHR | 42 | 320 | Silicon probe; tip aspect ratio >= 10:1; Al reflex coated Very steep sidewalls |
NanoWorld |
| AR10T-NCH | 42 | 330 | Silicon probe; tip aspect ratio >= 10:1; tip tilt = 13deg Veeco equiv - FIB2-100S Very small openings; Very steep sidewalls |
Nanosensors |
| AR10T-NCHR | 42 | 330 | Silicon probe; tip aspect ratio >= 10:1; tip tilt = 13deg; Al reflex coated Veeco equiv - FIB2-100A Very small openings; Very steep sidewalls |
Nanosensors |
| AR5-NCH | 42 | 330 | Silicon probe; tip aspect ratio >= 5:1 Veeco model - TESP-HAR Steep sidewalls |
Nanosensors |
| AR5-NCHR | 42 | 330 | Silicon probe; tip aspect ratio >= 5:1; Al reflex coated Veeco model - TESPA-HAR Steep sidewalls |
Nanosensors |
| AR5-NCHR | 42 | 320 | Silicon probe; tip aspect ratio >= 5:1; Al reflex coated Veeco model - TESPA-HAR Steep sidewalls |
NanoWorld |
| AR5-NCL | 48 | 190 | Silicon probe; tip aspect ratio >= 5:1 Steep sidewalls |
Nanosensors |
| AR5-NCLR | 48 | 190 | Silicon probe; tip aspect ratio >= 5:1; Al reflex coated Steep sidewalls |
Nanosensors |
| AR5-NCLR | 48 | 190 | Silicon probe; tip aspect ratio >= 5:1; Al reflex coated Steep sidewalls |
NanoWorld |
| AR5T-NCH | 42 | 330 | Silicon probe; tip aspect ratio >= 5:1; tip tilt = 13deg Veeco equiv - HAR1-200 Small openings; Steep sidewalls |
Nanosensors |
| AR5T-NCHR | 42 | 330 | Silicon probe; tip aspect ratio >= 5:1; tip tilt = 13deg; Al reflex coated Small openings; Steep sidewalls |
Nanosensors |
| AR5T-NCHR | 42 | 320 | Silicon probe; tip aspect ratio >= 5:1; tip tilt = 13deg; Al reflex coated Small openings; Steep sidewalls |
NanoWorld |
| LATERAL FORCE | k (N/m) | f0 (kHz) | Description/Applications | Manufacturer |
| PNP-DB | 0.48 0.06 |
67 17 |
Nitride probe; 2 levers; Au reflex coated General samples; LFM; Force measurements |
NanoWorld |
| PPP-LFMR | 0.2 | 23 | Silicon probe; Al reflex coated LFM; General samples; Force measurements |
Nanosensors |
| RC800PSA | 0.39 0.05 0.76 0.10 |
69 18 71 19 |
Nitride probe; 4 levers; Au reflex coated Veeco model - ORC8 General samples; LFM; Force measurements |
Olympus |
| MAGNETIC FORCE | k (N/m) | f0 (kHz) | Description/Applications | Manufacturer |
| ASYMFM | 2 | 70 | Silicon probe; MFM standard; 400 Oe; 1e-13EMU; 50nm CoCr reflex/tip coated Veeco equiv - MESP MFM |
Asylum |
| ASYMFMHC | 2 | 70 | Silicon probe; MFM high coercivity; > 5000 Oe; 45nm CoPt/FePt reflex/tip coated Veeco equiv - MESP-HC MFM |
Asylum |
| ASYMFMHM | 2 | 70 | Silicon probe; MFM high moment; 575 Oe; 3e-13EMU; 100nm CoCr reflex/tip coated Veeco equiv - MESP-HM MFM |
Asylum |
| ASYMFMLC | 2 | 70 | Silicon probe; MFM low coercivity; < 10 Oe; < 1e-13EMU; 30nm permalloy reflex/tip coated Veeco equiv - MESP-LC MFM |
Asylum |
| ASYMFMLM | 2 | 70 | Silicon probe; MFM low moment; < 400 Oe; 3e-14EMU; 15nm CoCr reflex/tip coated Veeco equiv - MESP-LM MFM |
Asylum |
| ASYMFMSMPL | 2 | 70 | Five each of Asylum MFM levers (ASYMFM; ASYMFMHC; ASYMFMHM; ASYMFMLC; ASYMFMLM) Veeco equiv - MESPSP MFM |
Asylum |
| MFMR | 2.8 | 75 | Silicon probe; MFM standard; Co alloy coated tip; Al reflex coated MFM |
NanoWorld |
| PPP-LC-MFMR | 2.8 | 75 | Silicon probe; MFM lo coercivity; soft magnetic coated tip; Al reflex coated MFM |
Nanosensors |
| PPP-LM-MFMR | 2.8 | 75 | Silicon probe; MFM lo moment; Co alloy coated tip; Al reflex coated MFM |
Nanosensors |
| PPP-MFMR | 2.8 | 75 | Silicon probe; MFM standard; Co alloy coated tip; Al reflex coated MFM |
Nanosensors |
| PPP-QLC-MFMR | 2.8 | 75 | Silicon probe; MFM lo coercivity; Q factor = 30k - 50k in UHV; soft magnetic coated tip; Al reflex coated MFM |
Nanosensors |
| S-MFMR | 2.8 | 75 | Silicon probe; MFM lo coercivity; soft magnetic coated tip; Al reflex coated MFM |
NanoWorld |
| SC-10-M | 2.8 | 75 | Silicon probe; MFM hi-resolution; > 1000 Oe; CoNi side-coated tip; Al reflex coated MFM |
SmartTip |
| SC-20-LM | 2.8 | 75 | Silicon probe; MFM hi-resolution; < 50 Oe; Ni side-coated tip; Al reflex coated MFM |
SmartTip |
| SC-20-M | 2.8 | 75 | Silicon probe; MFM hi-resolution; > 1000 Oe; CoNi side-coated tip; Al reflex coated MFM |
SmartTip |
| SC-35-LM | 2.8 | 75 | Silicon probe; MFM hi-resolution; < 50 Oe; Ni side-coated tip; Al reflex coated MFM |
SmartTip |
| SC-35-M | 2.8 | 75 | Silicon probe; MFM hi-resolution; > 1000 Oe; CoNi side-coated tip; Al reflex coated MFM |
SmartTip |
| SSS-MFMR | 2.8 | 75 | Silicon probe; MFM hi res; Co alloy coated tip; Al reflex coated Veeco equiv - MESP-HR MFM |
Nanosensors |
| SSS-QMFMR | 2.8 | 75 | Silicon probe; MFM hi res; Quality factor 30k - 50k in UHV; Co alloy coated tip; Al reflex coated MFM |
Nanosensors |
| SUPER SHARP | k (N/m) | f0 (kHz) | Description/Applications | Manufacturer |
| SSS-FM | 2.8 | 75 | Silicon probe; tip radius < 5nm Nanoscale features |
Nanosensors |
| SSS-FMR | 2.8 | 75 | Silicon probe; tip radius < 5nm; Al reflex coated Nanoscale features |
Nanosensors |
| SSS-NCH | 42 | 330 | Silicon probe; tip radius < 5nm Veeco model - TESP-SS Nanoscale features |
Nanosensors |
| SSS-NCH | 42 | 320 | Silicon probe; tip radius < 5nm Veeco model - TESP-SS Nanoscale features |
NanoWorld |
| SSS-NCHR | 42 | 330 | Silicon probe; tip radius < 5nm; Al reflex coated Nanoscale features |
Nanosensors |
| SSS-NCL | 48 | 190 | Silicon probe; tip radius < 5nm Nanoscale features |
Nanosensors |
| SSS-NCL | 48 | 190 | Silicon probe; tip radius < 5nm Nanoscale features |
NanoWorld |
| SSS-NCLR | 48 | 190 | Silicon probe; tip radius < 5nm; Al reflex coated Nanoscale features |
Nanosensors |
| SSS-SEIH | 15 | 130 | Silicon probe; tip radius < 5nm Nanoscale features |
Nanosensors |
| SSS-SEIH | 15 | 130 | Silicon probe; tip radius < 5nm Nanoscale features |
NanoWorld |
| SSS-SEIHR | 15 | 130 | Silicon probe; tip radius < 5nm; Al reflex coated Nanoscale features |
Nanosensors |
| TIPLESS | k (N/m) | f0 (kHz) | Description/Applications | Manufacturer |
| Arrow TL1 | 0.03 | 6 | Silicon probe; arrow shaped; tipless; single lever Custom tip attachment; Force measurements |
NanoWorld |
| Arrow TL1Au | 0.03 | 6 | Silicon probe; arrow shaped; tipless; single lever; Au coated Lever functionalization; Binding detector |
NanoWorld |
| Arrow TL2 | 0.03 | 6 | Silicon probe; arrow shaped; tipless; dual lever at 250um pitch Custom tip attachment; Force measurements |
NanoWorld |
| Arrow TL2Au | 0.03 | 6 | Silicon probe; arrow shaped; tipless; dual lever at 250um pitch; Au coated Lever functionalization; Binding detector |
NanoWorld |
| Arrow TL8 | 0.03 | 6 | Silicon probe; arrow shaped; tipless; eight levers at 250um pitch Custom tip attachment; Force measurements |
NanoWorld |
| Arrow TL8Au | 0.03 | 6 | Silicon probe; arrow shaped; tipless; eight levers at 250um pitch; Au coated Lever functionalization; Binding detector |
NanoWorld |
| PNP-TR-TL | 0.32 0.08 |
67 17 |
Nitride probe; tipless; 2 levers; Au reflex coated Custom tip attachment; General samples; Force measurements |
NanoWorld |
| PNP-TR-TL-Au | 0.32 0.08 |
67 17 |
Nitride probe; tipless; 2 levers; Au reflex/tip coated Lever functionalization; Binding detector |
NanoWorld |
| TL-CONT | 0.2 | 13 | Silicon probe; tipless Custom tip attachment; General samples; Force measurements |
Nanosensors |
| TL-FM | 2.8 | 75 | Silicon probe; tipless Custom tip attachment; General samples; Force measurements |
Nanosensors |
| TL-NCH | 42 | 330 | Silicon probe; tipless Custom tip attachment; General samples; Force measurements |
Nanosensors |
| TL-NCL | 48 | 190 | Silicon probe; tipless Custom tip attachment; General samples; Force measurements |
Nanosensors |
| ULTRA-SMALL | k (N/m) | f0 (kHz) | Description/Applications | Manufacturer |
| AC10DS | 0.1 | 1500 | NEW BioLever Fast Nitride probe; Au reflex coated Fast imaging; Bio samples; Soft samples |
Olympus |
| Arrow UHF | 6 | 850 | Silicon probe; arrow shaped; Al reflex coated Fast imaging |
NanoWorld |
| Arrow UHFAuD | 6 | 850 | NEW Silicon probe; arrow shaped; Au reflex coated Atomic resolution |
NanoWorld |
| BL-AC40TS | 0.25 | 130 | BioLever Mini Silicon tip on nitride lever; low noise; Au reflex coated Bio samples; Soft samples |
Olympus |
| USC-EBD-0.3 | 0.3 | 180 | NEW Carbon EBD tip on silicon lever; Au reflex coated Fast imaging |
Nanotools |
| USC-EBD-2.0 | 3 | 1200 | NEW Carbon EBD tip on silicon lever; Au reflex coated Fast imaging; Atomic resolution |
Nanotools |
| USC-EBD-5.0 | 30 | 3600 | NEW Carbon EBD tip on silicon lever; Au reflex coated Fast imaging; Atomic resolution |
Nanotools |
| iDrive ACTUATED | k (N/m) | f0 (kHz) | Description/Applications | Manufacturer |
| BL-TR400PB | 0.09 0.02 |
32 10 |
iDrive-N01 Nitride probe; Au reflex/tip coated Bio samples; Soft samples |
Asylum |
| BL-TR800PB | 0.61 0.16 |
68 22 |
iDrive-N02 Nitride probe; Au reflex/tip coated General samples; Soft samples |
Asylum |
|
Asylum Research •
6310 Hollister Ave. •
Santa Barbara, CA 93117 •
888-472-2795 •
805-696-6466 voice •
805-512-9805 fax •
Probe Store email
|