|May 8, 2013||Asylum Research Introduces the MFP-3D-Origin™ —
A High Performance, Affordable Atomic Force Microscope
|Apr. 22, 2013||Asylum Research Hosts a New Webinar May 22:
“Getting Started with AFM in Biology – It's Easier Than You Think”
|Mar. 18, 2013||Asylum Research Appoints Amir Moshar to West Coast US Technical Sales|
|Mar. 11, 2013||Asylum Research Announces the Hire of Scientist Florian Johann for Atomic Force Microscopy Applications in Germany/Continental Europe|
|Dec. 17, 2012||Oxford Instruments plc Acquires Asylum Research Corp.|
|July 16, 2012||Asylum Research Appoints ATSL – Advanced Technological Solutions Ltd., as its Exclusive Israeli Distributor|
|June 6, 2012||Asylum Research Appoints Spectra Research Corp. as its Exclusive Canadian Distributor|
|May 29, 2012||Asylum Research Introduces the AFM Industry’s First Five-Year Instrument Warranty|
|May 15, 2012||The Asylum Research Cypher™ AFM Featured in Course Instruction at the Marine Biological Laboratory Physiology Short Course, Summer 2012|
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|Asylum Research and the Frederick Seitz Materials Research Laboratory at the University of Illinois Urbana-Champaign present the Advanced AFM Workshop, March 21-22|
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May 8, 2013 (Santa Barbara, CA) Asylum Research, an Oxford Instruments company, announces the new MFP-3D Origin Atomic Force Microscope (AFM). The MFP-3D Origin is at the intersection of performance and affordability in the Asylum Research MFP-3D™ AFM family. The MFP-3D Origin features the technical excellence, innovation, and world-class customer support that is the trademark of every Asylum AFM. With full upgrade potential to the MFP-3D and its complete range of accessories, the MFP-3D Origin is the best place to start with atomic force microscopy.
“We are very excited that we can now bring the high performance capabilities of the MFP-3D to a larger group of researchers,” commented Ben Ohler, AFM Business Manager. “Since not all customers require its most advanced accessories and features, we were able to reduce costs there instead of sacrificing core performance. This is in stark contrast to some competitors who have taken old technology and repackaged it as entry-level AFMs with lower performance. We have heard many times over that ‘if I had the funds, I would buy an Asylum’. The MFP-3D Origin allows limited research budgets to be focused on what’s most important – leading closed-loop resolution and performance, robust reliability, and of course, the unmatched customer support you get when you become an Asylum customer.”
The performance and modern features of the MFP-3D Origin surpass all competitors in its class. It is based on the technology-leading MFP-3D AFM, known for closed-loop precision, high-resolution imaging, and low-noise force measurements. The MFP-3D Origin offers far more than just the basic scan modes. It includes many advanced modes–nanolithography, Dual AC™ Mode, and piezoresponse force microscopy– at no extra charge. Additional advanced functionality is easy to add for optional modes such as conductive AFM, AM-FM Viscoelastic Mapping for nanomechanical analysis, scanning tunnelling microscopy (STM), and scanning thermal microscopy (SThM).
As your research grows, so can the MFP-3D Origin’s capabilities. The MFP-3D Origin can easily be upgraded to the full MFP-3D to take advantage of the numerous environmental and advanced application accessories. In addition, the MFP-3D Origin carries a full two year warranty – the best warranty in its class. It’s a smart investment in a proven AFM platform that will serve you well for years to come.
April 22, 2013 - Asylum Research, an Oxford Instruments company, will host a new webinar on May 22 – “Getting Started with AFM in Biology – It’s Easier Than You Think”. Asylum Applications Scientist Dr. Irène Revenko, who has over 19 years of teaching and training AFM in biology, will be presenting and taking questions. The webinar is ideal for biologists that are new to AFM or for AFM experts starting to study biology.
The webinar will cover topics that are critical for successful AFM imaging including sample preparation, choosing the correct cantilever, imaging in fluids and choosing the correct measurement mode. These will be presented in the context of four case studies of typical biological samples:
“There are some basic principles that help ensure successful AFM in biology,” said Dr. Revenko. “While biological samples can be complex, this webinar will show how complexity can be managed with extremely useful tips, tricks and techniques to make AFM in biology easier. Ultimately, the goal of the webinar is to give researchers the confidence to repeat these experiments and then extend them to fit their own research.”
Registration for the 8:00am session is at https://www3.gotomeeting.com/register/702661318.
Registration for the 4:00pm session is at https://www3.gotomeeting.com/register/707007462.
Attendance will be limited, so early registration is recommended.
March 18, 2013 - As part of its ongoing expansion, Asylum Research, an Oxford Instruments company, has appointed Amir Moshar for West Coast US Technical Sales. Amir has been with Asylum for over nine years, holding various technical positions. He began as a test engineer, then continued to lead AFM technical support in the UK for two years. Upon return to the US and until now, Amir has served as an applications scientist, gaining unique insights into customer support and user needs. He has been instrumental in new applications development, user training and running customer demonstrations. Amir received his MS degree in Electrical Engineering from the University of California, Santa Barbara.
“We are very excited to welcome Amir to our technical sales group,” said John Green, Senior Vice President of Sales for Asylum Research. “He perfectly matches the background of our team members –numerous years of Atomic Force Microscopy (AFM) experience and scientific applications background. His broad experience working with scientists from the applications side and his extensive knowledge of the instrumentation will make him a great resource for customers looking for straightforward answers in AFM.
Asylum Research, the technology leader in atomic force microscopy, has global sales and service, including offices in Germany, UK, and Taiwan. Its product line of scanning probe/atomic force microscopes including the Cypher™ and MFP-3D™ AFM family, has set the industry standard for technological innovation for both imaging and characterizing many properties of surfaces and structures at the nanoscale. Its AFM/SPMs are used by academic and industrial customers across the world for a wide range of materials and bioscience applications.
March 11, 2013 - As part of its ongoing expansion, Asylum Research, an Oxford Instruments company, is pleased to introduce Florian Johann as its newest Applications Scientist. Johann will be based in the Mannheim, Germany office and will support customers throughout Germany and continental Europe.
“We are very excited about adding Florian Johann to the outstanding list of talented Applications Scientists at Asylum in general and specifically here at our office in Germany,” said Ludger Weisser, Director of European Sales for Asylum Research Germany. “His AFM background in materials science will complement the research that is being done on next-generation materials by leading labs throughout Germany and Europe. Florian will also enable us to expand the personalized applications support that we offer to all of our customers."
"Our goal is to expand our scientific staff in the region to provide the best, most comprehensive customer service, support and accessibility to our customers," commented Roger Proksch, President of Asylum Research. "Florian will enable us to continue to build our strong partnerships in the region, with great science being the ultimate result."
Asylum Research, the technology leader in atomic force microscopy, has a worldwide presence with subsidiaries in the Germany, UK, and Taiwan. Its product line of scanning probe/atomic force microscopes, including the Cypher™ and MFP-3D™ AFM family, has set the industry standard for technological innovation for both imaging and characterizing many properties of surfaces and structures at the nanoscale. Its AFM/SPMs are used by academic and industrial customers across the world for a wide range of materials and bioscience applications.
December 17, 2012 - Asylum Research, the technology leader in scanning probe/atomic force microscopy, announces that it has been acquired by Oxford Instruments plc ("Oxford Instruments"), a leading provider of high technology tools and systems for industry and research. The acquisition is subject to customary conditions of the London Stock Exchange and is expected to be completed before the end of December 2012.
Asylum Research is an established US company based in Santa Barbara, California, with subsidiaries in the UK, Germany and Taiwan. Its SPM technology is used to image and characterise the properties of surfaces and structures down to the atomic scale providing invaluable information to enable development and exploitation at the nanoscale. Its products are used by academic and industrial customers across the world for a wide range of materials and bioscience applications. The combination of Oxford Instruments and Asylum Research strengthens the Group's Nanotechnology Tools sector. SPM is a fundamental nanotechnology measurement technique and complements the existing portfolio of products and technologies within the Group.
"We are very excited about joining Oxford Instruments," commented Dick Clark, co-founder and Chief Financial Officer. "The synergies between our companies are extensive and we're looking forward to joining this elite company that has proven leadership in the scientific instrumentation business."
Commenting on the acquisition, Jonathan Flint, Chief Executive of Oxford Instruments, stated, "the acquisition of Asylum Research significantly increases our footprint in the nanotechnology space and complements our strong position in electron microscopes with a presence in another fundamental nanotechnology measurement technique. The acquisition also gives us access to the rapidly growing bio-nano market as it allows customers to perform analysis of organic samples in their natural liquid environments, something which cannot readily be done using electron microscopes."
Added Roger Proksch, President of Asylum Research, "it was clear from the beginning of our talks that Asylum Research and Oxford Instruments both share the same core values while providing world class customer support and service, and making the most technologically-advanced instruments. We are looking forward to joining their team and getting the best AFMs to scientists faster and with even more capabilities."
"I would like to thank all our customers, employees and business associates for getting us to this point in our company history," said Jason Cleveland, Chief Executive Officer of Asylum Research. "Our passion for science has always been at Asylum's forefront. Partnering with Oxford Instruments will allow us to do an even better job at bringing instrumentation to scientists for discoveries that will ultimately lead to amazing innovations.”Asylum Research, founded in 1999 as an employee-owned company in Santa Barbara, California, has a worldwide presence with subsidiaries in the UK, Germany and Taiwan. Its product line of scanning probe/atomic force microscopes, including the Cypher™ and MFP-3D™ AFM family, has set the industry standard for technological innovation for both imaging and characterizing many properties of surfaces and structures at the nanoscale. Its AFM/SPMs are used by academic and industrial customers across the world for a wide range of materials and bioscience applications.
A conference call for analysts and investors will be held at 08.30 (UK time) today to discuss this statement.
Notes to Editors
About Asylum Research
For further information please contact:
Oxford Instruments Plc +44 (0)1865 393200
July 16, 2012 - As part of its ongoing expansion, Asylum Research, the technology leader in scanning probe and atomic force microscopy (SPM/AFM), announced today that it has appointed ATSL, Advanced Technological Solutions Ltd., as its exclusive distributor in Israel. ATSL managers have served nanotechnology and surface science markets in Israel for over 11 years and offer sales, service and technical support across the country. ATSL can be contacted at +972-54-7766639 or via email: email@example.com.
“We are very excited about adding ATSL to our family of world-wide distributors,” said John Green, Executive Vice President of Sales for Asylum Research. “Their extensive experience in scientific equipment sales to academic, industrial and government markets, for both materials and life science, will be a great asset to Asylum Research and our ability to help prospective customers make informed decisions."
Gil Amzalag, Co-CEO of ATSL, added, “We are very pleased to be working with Asylum Research in Israel. Asylum has a great reputation for innovative AFM technology, and a legacy of customer satisfaction that is unmatched in the industry. This addition is a good fit with our focus on Israeli markets that include nanotech, surface science and materials characterization. ”
ATSL, co-founded by Gil Amzalag and Rony Shteinberg, is a dynamic agencies company which represents companies that have advanced technology and unique products, and deliver added values to their Israeli customers which include Israeli academy science faculties, industry (high tech, pharma, biotechnology, defense), governmental institutions, hospitals, and others.
June 6, 2012 - As part of its ongoing expansion, Asylum Research, the technology leader in scanning probe and atomic force microscopy (SPM/AFM), announced today that it has appointed Spectra Research Corporation (SRC) as its exclusive distributor in Canada. SRC has served nanotechnology and surface science markets in Canada since 1993. They offer sales, service and technical support across the country. SRC can be contacted at 905-890-0555, or via their website: www.spectraresearch.com.
“We are very excited about adding Spectra Research to our family of world-wide distributors,” said John Green, Executive Vice President of Sales for Asylum Research. “Their extensive experience in AFM, materials and life science, and scientific instrumentation, will be a great asset to Asylum Research and our ability to help prospective customers make informed decisions."
Paul Greenwood, President of SRC, added, “We are very pleased to be working with Asylum Research in Canada. Asylum has a great reputation for innovative AFM technology, and a legacy of customer satisfaction that is unmatched in the industry. This addition is a good fit with our focus on Canadian markets that include nanotech, surface science and materials characterization”.
Spectra Research is a subsidiary of Allan Crawford Associates (ACA), one of Canada's largest distributors of electronic components, test equipment, and integrated networking solutions, with headquarters in Ontario, Canada.
May 29, 2012 - Asylum Research announced today that it has extended its standard two-year warranty coverage to five years on all its Atomic Force/Scanning Probe Microscopes, an industry first. The five-year “bumper-to-bumper” warranty covers parts and labor on Asylum’s Cypher™, MFP-3D™ Atomic Force Microscopes (AFMs) and MFP NanoIndenters. In the unlikely event of a breakdown during normal usage, Asylum will repair the system, or replace the broken part, at zero cost to the user. This new warranty coverage sets a new and higher standard for customer protection. Asylum offers the lowest cost of ownership of any AFM company, including lifetime hardware/software support at no charge, free software updates, and free OnSight™ online remote diagnosis. In addition, Asylum has the fastest repair turnaround in the industry, averaging less than eight working hours initial response time, 24 hour solution/diagnosis time, and 48 hour in-factory repair/replace time.
“We want our customers to know that when they purchase an Asylum instrument that they become part of the Asylum family – with our assurance that we will take care of them with the best products, hardware, software and applications support available," commented Jason Cleveland, Asylum CEO. "Due to the high reliability of our AFMs, we don’t make much money on service. When we looked at the numbers, this was an easy decision to make.”
“Many customers don’t consider the cost of ownership when they purchase other AFMs and get stuck with costly repairs and downtime in the future," added Roger Proksch, Asylum President. "Customer support has always been our priority, not a profit center. Our customer support team has been a huge advocate for offering the additional coverage. It is on their recommendation that we are extending this warranty back to all customers who purchased an Asylum instrument after January 1, 2012."
Learn more about Asylum's outstanding customer support.
Asylum Research, the technology leader in scanning probe and atomic force microscopy (SPM/AFM) will provide both educators and equipment for the Marine Biological Laboratory Physiology Course being held at Woods Hole, MA June 9 through July 29. The Cypher™ Atomic Force Microscope (AFM), the world's highest resolution and fastest AFM, will be on-site for instruction and hands-on research, including investigation of microtubules, severing proteins that form clusters on microtubules, dyneins, formins binding to microtubules, and catalyzing actin polymerization. These techniques will be demonstrated on the surface and in vitro. For researchers not enrolled in the course, the Cypher AFM will be available for individual demonstrations when not being used for class.
“We are looking forward to using the Cypher AFM for the course,” said Christoph Schmidt, Professor of Physics Georg-August-Universität and class instructor. "We are also extremely pleased that Asylum Research scientists and co-founders will be giving lectures and assisting the students throughout the course. Their AFM expertise in biology and physics is unsurpassed and will be invaluable to all of the students."
Jason Cleveland, CEO of Asylum Research, noted, "We are very excited about participating in the very prestigious MBL Course. It's been something we've wanted to do for a long time and we're really looking forward to this collaboration with Dr. Schmidt."
Additional information on the MBL Physiology Course can be found at: http://www.mbl.edu/education/courses/summer/course_physio.html. Researchers not attending the course can schedule an individual demo by contacting firstname.lastname@example.org.
Monteith G. Heaton: 1952-2012
It is with great sadness that that we pass on the news that we lost Monte, Asylum's EVP of Marketing, on Friday afternoon, May 4th. He died of an unexpected heart attack while returning from one of his regular lunch-time basketball games. He had just turned 60 in March. Monte had been at Asylum since 2008. He will be sorely missed by all.
April 26, 2012 - Asylum Research, the technology leader in scanning probe and atomic force microscopy (SPM/AFM), will present Part 1 of three nanomechanics webinars on May 23. This first webinar, entitled “Introduction and Innovations in High Speed Quantitative Nanomechanical Imaging,” will begin with a survey of the mechanical properties that can be investigated with the wide array of available nanoscale property mapping techniques. We will then introduce two new techniques that allow unambiguous interpretation of material nanomechanical properties: AM-FM and Loss Tangent. Amplitude-modulated (AM) atomic force microscopy, also known as tapping mode, is a proven, reliable and gentle imaging method with wide spread applications. Previously, the contrast in tapping mode has been difficult to quantify. The new AM-FM imaging technique combines the features and benefits of normal tapping mode with the quantitative, high sensitivity of Frequency Modulation (FM) mode. Loss Tangent imaging is another recently introduced quantitative technique that recasts the interpretation of phase imaging into one term that includes both the dissipated and stored energy of the tip sample interaction. These techniques allow high speed, low force imaging in tapping mode while providing quantitative Elasticity and Loss Tangent images. Registration details can be found here.
Said presenter and Asylum Research President Dr. Roger Proksch, “Nanoscale mechanical properties cover a breathtaking range of values. For example, the elastic modulus of common materials can range well over five or six orders of magnitude. The same can be said of the loss modulus of materials, with metal, glasses, and ceramics with low dissipation often behaving like ideal elastic solids, while many elastomers behave almost like liquids. A single nanomechanical technique – such as a force curve – is simply insufficient for accurately revealing sample properties and can often yield misleading and even inaccurate conclusions. Put simply, if all you have is a hammer, then all of your problems start to look like nails. During the course of this webinar series we will be looking at the wide range of techniques available to the researcher to cover the wide range of properties with which nature challenges us. A primary goal of this seminar series is to provide researchers with a solid overview of nanomechanical measurements, enabling them to critically interpret these measurements, and to provide a solid foundation for their future research.”
February 16, 2012 - Asylum Research, the technology leader in scanning probe and atomic force microscopy (SPM/AFM) and the Frederick Seitz Materials Research Laboratory (FSMRL) at the University of Illinois Urbana Champaign (UIUC), announce The Advanced AFM Workshop on March 21-22, 2012. The workshop will combine instructional lectures and tutorial instrument demonstrations, as well as tips, tricks and new techniques in Atomic Force Microscopy. Topics will include electrical characterization (conductive AFM, SKPM, EFM), Piezoresponse Force Microscopy (PFM), multifrequency techniques, new scanning techniques for nanomechanical characterization, and a tutorial on IGOR Pro software. UIUC researchers will also present current research on PFM, quantitative nanotube measurements, as well as combined AFM and Raman spectroscopy. In addition to UIUC personnel, the workshop is also open to all other researchers that want to learn more about these advanced AFM scanning techniques.
Jason Cleveland, CEO of Asylum Research, noted, "There are over 200 AFM researchers and students using our instruments at UIUC’s FSMRL. This is an excellent opportunity for us to educate, train, and pass along our knowledge to both established and up and coming researchers as part of our continuing commitment to support the scientists of tomorrow. Exciting research is coming out of many departments at UIUC and we're very pleased that Asylum AFMs have been an important part of their scientific discoveries."
William L. Wilson, Principal Scientist and Director of Central Facilities of the Frederick Seitz Materials Research Laboratory, notes, “As nanofabrication and nanoscale engineering move to the mainstream, the need for a wide array of analytical tools is apparent. Scanning probe microscopies like AFM which were once considered exotic research systems have become workhorse tools. It is extremely important that our user base continue to be conversant with the industry’s newest techniques and technologies. This workshop will provide a unique opportunity for researchers of all disciplines to learn how these techniques can transform their research.”
Added Scott MacLaren, Director of AFM Operations for the MRL, “We are very pleased to be hosting the Advanced AFM Workshop with Asylum. This is an exceptional opportunity to learn from the experts about advanced AFM techniques. Our goal is to make this workshop as practical and beneficial as possible for all our researchers."
A small registration fee of $40 will be charged for the workshop for lunches and breaks for both days. Attendees must register at http://mrl.illinois.edu/AFM2012/. Additional information and can be found at http://www.AsylumResearch.com/Events/UIUC2012/.
January 30, 2012 - Asylum Research, the technology leader in scanning probe/atomic force microscopy (SPM/AFM), is initiating its 2012 Webinar Series on February 22. The first webinar will focus on ultra-high resolution imaging. AFM pioneer, inventor and Asylum Research co-founder, Dr. Jason Cleveland, will present “Smaller and Quieter: Ultra-high Resolution AFM Imaging.”
Miniaturization of cantilevers for Atomic Force Microscopy has increased their resonant frequencies and decreased their thermal noise, allowing faster, lower noise measurements. When used in the extremely low noise Cypher™ AFM, these levers have enabled significant improvements in imaging resolution in air and especially in liquids. On crystals, individual atomic point defects can now be routinely resolved, and this higher resolution also extends to biological samples. Examples to be shown include the movement of individual point defects in bacteriorhodopsin, atomic point defects in calcite, and resolution of the double-helix structure of DNA in solution.
“Recent advances in cantilever and AFM system design have enabled imaging and measurements that were previously not possible. I’ll talk about these advances and show some of our latest achievements and capabilities, which I think will be of substantial interest to the full spectrum of AFM users, from beginners to the most experienced,” said Dr. Cleveland.
To register, please go to www3.gotomeeting.com/register/982536366. Attendance will be limited, so early registration is recommended.
Additional Asylum Research webinars in the coming months will include topics such as fast imaging and nanomechanical analysis tools. Details can be found at the www.AsylumResearch.com.
November 29, 2011 - Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM) announces its Atomic Force Microscopy (AFM) in Biology Class will be held January 25-27, 2012 in Santa Barbara, California. The class is open to all AFM users that want to increase their knowledge of AFM in biology and life sciences. This world-renowned class, now in its 14th session, combines lecture with hands-on sessions for personal instruction and interaction with the Asylum technical staff.
“We cover all the essential AFM topics that biologists need and want to learn about – from sample preparation to advanced imaging and force measurements,” said Dr. Nicholas Geisse, Applications Scientist. “The breadth of AFM experience of our staff is unsurpassed – in addition, both our President and CEO participate and class attendees have access to our entire scientific staff. Because only two to three people share an instrument for the hands-on experiments, the training is invaluable."
Commented previous student Dr. Anthony Quinn of the University of Vermont Microscopy Imaging Center, "The AFM in Biology Class was very instructive. The literature, hands-on sample preparation labs, and imaging sessions on the MFP-3D-BIO™ and Cypher™ AFMs were very useful and applicable to our research endeavors. The staff was outstanding in that they made you feel like a part of a caring family – and since the class, the ongoing correspondence and assistance has also been stupendous. Thanks for the hospitality and great course!"
This three-day course is held twice a year. Topics include sample prep, imaging and force measurements on DNA, high resolution imaging of bacteriorhodopsin, force measurements and mapping, imaging and pushing lipid bilayers, and imaging live cells. Hands-on labs will be done on the MFP-3D™ Stand Alone, MFP-3D-BIO and the Cypher AFM, the world's fastest and highest resolution AFM. Class size is limited. More information and a PDF of the registration form can be downloaded here.
November 1, 2011 - Asylum Research, the technology leader in scanning probe/atomic force microscopy, introduces the new Variable Field Module2 (VFM2) for the MFP-3D Atomic Force Microscopes (AFM). The VFM2 is ideal for researchers who want to apply magnetic fields to their atomic force microscopy experiments and applies continuously adjustable magnetic fields parallel to the sample plane approaching one Tesla with one Gauss resolution. The module is useful for magnetic force microscopy (MFM), conductive AFM (C-AFM), and other applications where the sample's properties are magnetic field dependent.
The VFM2 easily attaches to the MFP-3D AFMs and features adjustable pole tips for optimal choice between maximum required field, sample placement and minimum field gradients. The Module uses a unique design incorporating rare earth magnets to produce the magnetic field. Maintaining a steady field produces no heat, thermal drift, or mechanical vibration. Field intensity is software controllable. An integrated Gaussmeter provides a quantitative measure of the applied magnetic field.
For experiments where combined magnetic field and a high tip-sample voltage bias are required, such as for studies of ferroelectric and piezoelectric materials, the VFM2 High Voltage Kit can be easily attached to the VFM2. The High Voltage Kit allows application of tip biases up to ±220V.
Commented Roger Proksch, President of Asylum Research, “Prior to the introduction of the VFM2, high magnetic field measurements required complicated superconducting or water-cooled magnets, neither of which were particularly friendly to low-noise, high precision AFM measurements. Our team, headed by Maarten Rutgers, has made a startling increase in field strength along with increased measurement precision and ease of use. This is truly a major step forward in ambient AFM.”
October 11, 2011 - Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM), provides its full-function MFP-3D™ and Cypher™ Atomic Force Microscopes (AFMs) with superior capabilities which require no programming to perform advanced imaging and measurements. For more advanced, automated, and out-of-the-box experiments, Asylum also provides a user-driven programming language called IGOR. While programming can be a daunting task for the novice, our new MacroBuilder interface allows users to easily implement IGOR customization like a pro – without writing any code – by simply dragging MacroBuilder "Modules" together to form Macros that can automate many measurements and analyses and be saved for repeated use. Each Module performs a specific operation, such as moving the tip to a position, collecting thermal data, or displaying the next saved force plot. Automation can range from simple tasks where the user might want to make a sequence of measurements − say take a series of images with different setpoints or a series of force curves at different positions on a sample − to more sophisticated procedures where the MacroBuilder software makes intelligent decisions; for example, MacroBuilder can decide to change subsequent measurement routines depending on the outcome of previous experiments. An additional benefit is that automated data acquisition can vastly improve throughput and even increase repeatability by removing arbitrariness from the imaging and measurement process. The options are virtually limitless with over 50 Modules included with the Asylum software and more being actively added. MacroBuilder comes standard in the Asylum Research software at no additional cost to the user. No other AFM system offers this kind of customizability and automation, another example of the power and flexibility of Asylum Research AFMs.
Commented Roger Proksch, President of Asylum Research, “MacroBuilder is a major advancement for automating AFM experiments. We expect it will revolutionize the way researchers work by allowing our users to run experiments completely unattended, including decision-making by the software based on pre-set ‘if-then’ instructions. It has already made big changes in the way I use our AFMs – I am really excited to see what our users do with it.”
September 6, 2011 - Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM), in conjunction with the Center for Nano- and Molecular Science and Technology (CNM) at the University of Texas at Austin, will be hosting an Atomic Force Microscopy (AFM) Workshop on September 14-15, 2011. The workshop will include lectures and equipment/imaging demonstrations/tutorials for both life science applications and electrical characterization of materials. Topics include force measurements and mapping, Scanning Kelvin Probe Microscopy (SKPM), nanomechanics in biology, piezoresponse force microscopy (PFM), thermal analysis and high resolution imaging with Cypher™, the world's fastest and highest resolution AFM. The workshop is open to current AFM researchers looking to learn more about AFM techniques, as well as those new to AFM that want to learn how AFM can be used in their own research.
“We are extremely pleased to be teaming with University of Texas at Austin for this workshop,” said John Green, EVP for Asylum Research. “The innovative research coming out of CNM affiliated research groups, including research to manipulate, analyze and control nanosized materials, and for understanding structure and reactivity relationships at materials interfaces is truly groundbreaking. Our workshop will also enable researchers to learn more about the capabilities of advanced AFM instrumentation, as well as to get invaluable tips for AFM operation.”
“This is a fantastic opportunity in working with the leading AFM manufacturer to educate and train existing and new practitioners in emerging AFM techniques and protocols across a broad range of applications,” said Prof. Keith Stevenson, CNM Director. “The development of nanoscience and technology depends strongly upon our ability to manipulate, analyze and control matter and energy on the atomic and molecular level. The development of new AFM methods and technology will play a key role in the state-of-the-art probing of electronic, optical, thermal, mechanical and electromechanical properties of nanostructures and devices.”
The first day of the seminar will include lectures from Asylum Research scientists as well as talks on the current work being done at the University of Texas at Austin. Equipment demonstrations will be done on the MFP-3D™ and Cypher AFMs. The second day of the workshop will include an overview lecture and dedicated demonstrations on the Cypher AFM for those interested in high speed, high resolution scanning. Limited spots are available. A registration fee of $20 will be charged to cover lunch and coffee breaks. Additional information and registration for the workshop can be found at www.AsylumResearch.com/Events/UTAustin2011/ .
September 1, 2011 - As part of its ongoing expansion, Asylum Research, the technology leader in scanning probe and atomic force microscopy (SPM/AFM), and its European distributor, Atomic Force F&E GmbH announced today that they have appointed Rafaël Barbattini to provide applications’ and product support for Asylum’s MFP-3D and Cypher AFM products in France. Rafaël has over 20 years experience in service and support of scientific instruments, including positions at IBM, UPSYS, and Veeco. Rafaël will be located in Paris and will be assisting our existing and prospective customers in France as well as surrounding countries. He can be contacted at +33 2 37 41 41 95, barbattini@AsylumResearch.fr.
Dr. Roland Goschke, Managing Director of Atomic Force F&E GmbH, commented: "We are happy to welcome Rafaël to Atomic Force. He is an important addition to our team and will be the primary contact for our growing base of French customers. They will enjoy his broad technical expertise, fast reaction times and competent support in all questions about AFM technology. Working from his office near Paris, he will be able to easily travel to most locations in France for on-site support. He has already impressed us with his knowledge and we are sure that this addition will strengthen Atomic Force's and Asylum Research's position in the French market."
Mr. Barbattini added, “Asylum Research is widely recognized for providing the best applications and product support in the AFM industry. Their MFP-3D™ and Cypher™ are also the best and most reliable AFMs available and my new position is a great opportunity for me to help their customers produce even better results and make more new discoveries. After many years experience in the AFM world I am really pleased to be reunited with some of the best names in the industry, and to be working with and increasing the dissemination of what is clearly the best AFM technology.”
August 18, 2011 - Asylum Research, the technology leader in Scanning Probe and Atomic Force microscopy, and Oak Ridge National Laboratory (ORNL) have just received the prestigious Microscopy Today Innovation (MT-10) Award for the development of Electrochemical Strain Microscopy (ESM). ESM is an innovative new scanning probe microscopy (SPM) technique implemented on Asylum’s Cypher™ and MFP-3D™ AFMs that is capable of probing electrochemical reactivity and ionic flows in solids on the sub-ten-nanometer level. ESM is the first technique that measures ionic currents directly, providing a new tool for mapping electrochemical phenomena on the nanoscale. The capability to probe electrochemical processes and ionic transport in solids is invaluable for a broad range of applications for energy generation and storage ranging from batteries to fuel cells. ESM has the potential to aid in these advances with two major improvements over conventional technologies: (a) the resolution to probe nanometer-scale volumes and (b) the inherent ability to decouple ionic from electronic currents with imaging capability extended to a broad range of spectroscopy techniques reminiscent of conventional electrochemical tools.
“We’re extremely excited to have won this prestigious award,” said Roger Proksch, President of Asylum Research. “Our collaboration with the Oak Ridge National Laboratory has put forth many new cutting-edge developments in the field of SPM, including Piezoresponse Force Microscopy, Switching Spectroscopy PFM, and Band Excitation. Asylum Research and our collaborators continue to lead the industry with technical innovation as confirmed by this award.”
Commented Sergei Kalinin, senior research staff member at the ORNL Center for Nanophase Materials Science, “Ionic phenomena in solids directly underpin multiple energy technologies ranging from batteries to fuel cells, as well as emergent electroresistive and memristive memories. Furthermore, very often they can contribute to observed physical phenomena in correlated oxides. Electrochemical Strain Microscopy provides the pathway to study the kinetics and thermodynamics of electrochemical processes in solids on the nanoscale, opening a window in these poorly explored aspects of materials functionality”.
Nina Balke added, “This is the first time we can actually see phenomena in batteries well below the100 nanometer level, observing their charging and degradation on the level of single structural defects.”
Concluded Stephen Jesse, the mastermind behind the development of ESM, “ESM offers an example of a multidimensional SPM technique that provides a new and decisive step towards understanding the nanoscale world of ionic systems.”
About Oak Ridge National Laboratory
August 9, 2011 - Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM), announced today that it has installed the first Cypher AFM system in China at the South China Normal University in Guangzhou. Cypher, the world’s fastest and highest resolution AFM, was installed in the lab of Professor Xingsen Gao at the SCNU Institute for Advanced Materials by personnel from Asylum Research and Grapes Hangzhou Technology Co. Ltd, Asylum’s representative in China. Professor Gao’s group will use Cypher to investigate advanced piezoelectric, ferroelectric, and multiferroic materials.
Professor Gao commented, “Our new Cypher AFM is the first of its kind in China. We chose Cypher because of its true atomic resolution and sophisticated PFM imaging techniques. We are planning to use it as a stable and powerful platform for probing various nanoscale properties on multifunctional materials with integration of other electrical characterization methods.”
Dr. David Beck, VP of Sales for Asylum Research in the Asia Pacific Region added, “We are very excited to have Professor Gao as our first Cypher user in China. His research on multifunctional materials will take full advantage of Cypher’s revolutionary design, specifically fast scanning, high resolution, and advanced PFM modes such as Dual AC Resonance Tracking (DART) and Band Excitation (BE). We expect that this will be the first of many more Cyphers in China as researchers see the benefits of its unique and advanced capabilities.”
Jason Cleveland, CEO of Asylum Research, will be demonstrating the Cypher AFM system at the upcoming China NANO 2011 conference in Beijing from September 7-9 (Booth C29).
Shown with the Cypher AFM system, left to right: Amir Moshar (Asylum Research), Prof. Xingsen Gao (SCNU), Dr. David Beck (Asylum Research), Yan Feng (HZGLP), and George Jiang (HZGLP).
June 23, 2011 – ETH Zurich, Atomic Force F&E GmbH and Asylum Research announce the third Euro AFM Forum 2011 to be held in Zurich, Switzerland on September 7 to 9 in cooperation with Prof. Ralph Spolenak at the campus Science City (Hönggerberg) of the Swiss Federal Institute of Technology Zurich (ETH Zürich). The Euro AFM Forum agenda will include both invited and submitted talks, a poster session, an image contest and the very popular instrument and equipment labs done on the Cypher™ and MFP-3D™ AFMs. Topics will focus on AFM for both materials and life science applications. The EuroForum is open to all AFM researchers that are looking to share their research with the AFM community and to learn tips and tricks of instrumentation and software.
Invited speakers include:
Ludger Weisser, General Manager of Atomic Force F&E commented, “We are very pleased to welcome researchers to the EuroForum at ETH Zurich. After successful previous meetings at the University of Muenster and the Technical University of Munich, we have chosen the ETH Zurich due to its high scientific ranking within Europe. With currently seven installations, including two of our new Cypher AFMs, the ETH is currently among the highest concentration of Asylum AFMs in Europe. The Material Science department is known for its great scientific work and we are privileged that they have partnered with us for the 2011 AFM Forum.”
Abstracts are currently being accepted for submitted talks and the poster session, with a deadline of August 15. The first circular is available for download at the conference website at:
June 6, 2011 – Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM) announces its Nanomechanics Class to be held August 16-18, 2011 in Santa Barbara, California. The class is geared toward beginner-to-intermediate level AFM users who want to gain a greater understanding of nanomechanical characterization techniques and instrumentation using AFM and instrumented nanoindenting. The class combines lectures and hands-on experiments designed to teach AFM theory, instrumentation and scanning modes used for contact mechanics, including properties such as stiffness, adhesion, viscoelasticity and others. Guest speakers will include Donna Hurley, National Institute of Standards and Technology (NIST), and Dalia Yablon, ExxonMobil Research and Engineering. Both researchers are doing ground-breaking work in the field of AFM and nanomechanics.
“We are very excited about offering this new class since nanomechanical characterization using AFM is becoming more essential in a wide range of applications from biomechanics to polymers," said Roger Proksch, President of Asylum Research. "The hands-on sessions are invaluable to demonstrate the breadth of measurements that can be done using AFM instrumentation.”
Hands-on equipment labs will be demonstrated on these Asylum Research instruments:
The Nanomechanics Class lectures and experiments will be tailored to the skill level and topics of interest of the registrants. Class size will be limited so as to provide individualized instruction. Students will be registered on a first-come, first-served basis and must register before July 8, 2011. A PDF of the registration form can be downloaded from the Asylum Research web site at www.AsylumResearch.com/Classes/NanomechanicsClass.pdf
May 17, 2011 - As part of its ongoing expansion, Asylum Research, the technology leader in scanning probe and atomic force microscopy (SPM/AFM), announced today that it has appointed Dr. Mark Reitsma as its Midwest US Sales Director. Dr. Reitsma received his PhD in Engineering from the University of Newcastle, Australia for his work with AFM on geomaterials. For the past eight years, Mark has been working in the area of AFM force measurement calibration and investigation of materials properties at the U.S. National Institute of Standards and Technology (NIST). Mark will be located in Chicago and will be assisting our existing and prospective customers in the Midwest region, including Kansas, Indiana, Iowa, Illinois, Kentucky, Michigan, Minnesota, Missouri, Nebraska, North Dakota, Ohio, South Dakota, and Wisconsin. Mark can be contacted at (202) 714-7731, email@example.com.
“We are very excited about adding Mark to our sales team,” said John Green, Executive Vice President of Sales for Asylum Research. “His extensive background in AFM and materials research will be a great asset to Asylum Research and our ability to help prospective customers make informed decisions."
Dr. Reitsma added, “After working in AFM metrology and surface science research for many years, I see my position at Asylum Research as a tremendous opportunity to interact with some of the most talented scientists and engineers in the field, helping them to make informed decisions on the Cypher™ and MFP-3D™ AFMs, the very best AFM instrumentation available.”
May 10, 2011 – Asylum Research, the technology leader in scanning probe and atomic force microscopy (SPM/AFM), announces its 3rd UK User Meeting and Forum to be held June 21 (before the RMS UK SPM Meeting) in Edinburgh, UK. All AFM researchers and Asylum users are invited to share their research with an informative day of technical talks, tutorials, equipment demonstrations and a poster session.
Dr. Chris Mulcahy, Managing Director of Asylum Research UK Ltd. commented, “The User Meeting and Forum is an excellent opportunity to learn what our colleagues are doing in their AFM research. It’s also our chance to show them exciting new technical capabilities through the very popular equipment demonstrations which give researchers the chance to ask-the-expert and learn tips and tricks on the AFM. It’s an educational, fun day spent with our AFM colleagues and a chance to acknowledge our users that are doing ground-breaking research.”
Abstracts are currently being accepted for talks and the poster session. Abstracts can be submitted until May 27, 2011. Prizes will be awarded for the best posters.
A small registration fee of £40 for faculty and £30 for students will be charged to cover teas, lunch and happy hour at the poster session. Additional information, abstract submission, and registration can be found at the conference website: http://www.AsylumResearch.com/Events/UKForum/
April 28, 2011 – Asylum Research, the technology leader in scanning probe and atomic force microscopy (SPM/AFM) announced today that its revolutionary Cypher AFM is routinely achieving resolution of atomic-scale point defects in liquid. While scanning tunneling microscopes have routinely demonstrated point defect resolution since their invention, this gold standard of true atomic resolution has been more elusive in AFM. Many commercial AFMs can routinely image atomic lattices in ambient and liquid conditions, but the lack of point defects has led most researchers to conclude that the contact areas are typically several atoms across. More recently, instrumental improvements have brought true atomic resolution to ultra-high vacuum (UHV) AFM. Achieving true-atomic resolution under ambient conditions at the liquid-solid interface brings this resolution to an environment highly relevant for much practical research. The Cypher AFM’s industry best signal-to-noise and support for ultra-small probes have enabled this breakthrough in atomic scale imaging.
Commented Jason Cleveland, Asylum Research CEO, “This raises the bar on what people should expect in terms of AFM resolution. Some AFM companies are renaming modes that have been around for years –such as frequency modulation or force volumes– and re-introducing them as “new” modes. Asylum Research has a different approach. We took the most popular imaging mode, AC-mode (also known as tapping, intermittent-contact, or dynamic AFM), kept the name and improved the resolution. The proof is in the images. Prior to this, no other commercial AFM has demonstrated resolution at this level.”
Several technological advancements make this atomic scale imaging achievement possible:
Successive AC mode topography images of the cleavage plane of a calcite crystal in water. The repeated point defects demonstrate the true atomic resolution capabilities of the Cypher AFM. Arrows indicate scan direction. Scan size 20nm; Z scale 3.2Å; Cantilever Amplitude 4Å; Cantilever Frequency 454 kHz.
April 5, 2011 - Abstracts for both oral presentations and a poster session are now being accepted for the 2nd International Workshop for Scanning Probe Microscopy for Energy Applications, June 8-10, 2011, at the Max Planck Institute for Polymers (MPIP) in Mainz, Germany, co-sponsored by AFM manufacturer, Asylum Research. The Workshop will focus on sharing new and innovative research involving characterization of the microscopic mechanisms underpinning solar cell, battery, and fuel cell operations, and materials used for alternative energy applications at the nanometer to micron range. Recent advances/techniques in SPM/AFM used to characterized energy relevant materials and systems will also be addressed. Deadline for abstract submission is May 20, 2011. Solicited abstract topics include, but are not limited to:
The 2nd Int’l Workshop for Scanning Probe Microscopy for Energy Applications is co-sponsored by MPIP and Asylum Research, the technology leader in Atomic Force/Scanning Probe Microscopy. Additional information on the agenda, invited speakers, abstract submission, and registration can be found at the conference website.
March 15, 2011 - Asylum Research, the technology leader in Scanning Probe and Atomic Force Microscopy (SPM/AFM), has announced the new Electrochemical Strain Microscopy (ESM) imaging technique for its Cypher™ and MFP-3D™ AFMs. Developed by Oak Ridge National Laboratory (ORNL) and Asylum Research, ESM is an innovative scanning probe microscopy (SPM) technique capable of probing electrochemical reactivity and ionic flows in solids on the sub-ten-nanometer level. ESM is the first technique that measures ionic currents directly, providing a new tool for mapping electrochemical phenomena on the nanoscale. The capability to probe electrochemical processes and ionic transport in solids is invaluable for a broad range of applications for energy generation and storage ranging from batteries to fuel cells. ESM has the potential to aid in these advances with two major improvements over other conventional technologies: (a) the resolution to probe nanometer-scale volumes and (b) the inherent ability to decouple ionic from electronic currents with (c) imaging capability extended to a broad range of spectroscopy techniques reminiscent of conventional electrochemical tools. Nina Balke of ORNL will be presenting recent results at the International Workshop on Scanning Probe Microscopy for Energy Applications (http://www.mpip-mainz.mpg.de/symposium/spm2011/) in Mainz, Germany, June 8-10 2011.
Commented Roger Proksch, President of Asylum Research, “Progress in energy storage and conversion will be greatly facilitated by the ability to study batteries and fuel cells at the level of several nanometers. ESM provides functional imaging of electrochemical phenomena in volumes millions to a billion times smaller than conventional current-based electrochemical techniques. This new technique opens the pathway to understanding energy technology and ionic devices on the level of individual grains and defects, thus bridging macroscopic functionalities and atomistic mechanisms. This in turn will lead to improved energy storage solutions – batteries with extremely high energy densities and long lifetimes and fuel cells with very high energy densities and efficiencies.”
"Traditionally, scanning probe microscopy techniques allowed measurement of electronic currents and short- and long-range forces," added Sergei Kalinin, Senior Research Staff Member in the Center for Nanophase Materials Sciences at ORNL and co-inventor (with Nina Balke and Stephen Jesse) of ESM. "ESM extends this capability to measure ionic currents, and has already been demonstrated for a variety of Li-ion cathode, anode, and electrolyte materials, as well as oxygen electrolytes and mixed electronic-ionic conductors. The ubiquitous presence of concentration-molar volume coupling in electrochemical systems suggests that this technique is in fact universal for solid state ionic imaging – from batteries and solid state to memristive electronics.
Stephen Jesse added “Perhaps even more importantly, the use of band excitation and DART engines allows measurements to be performed on rough surfaces of realistic electrochemical materials, making ESM useful for real materials and devices.”
March 9, 2011 - Asylum Research, the technology leader in Scanning Probe and Atomic Force Microscopy (SPM/AFM), has announced the new Electrochemistry Cell (EC Cell) for its MFP-3D™ AFMs. The EC Cell is a versatile platform for electrochemical experiments combined with AFM imaging. The EC Cell accommodates samples (working electrodes) of various sizes, including metal cylinders, flat conducting samples, and even conducting thin films on insulating substrates, and enables studies of deposition, oxidation, corrosion, and mass transfer of metals and other materials. Nanoscale topographical changes can be precisely monitored in situ as induced by electrochemical reactions. The cell provides for heating from ambient to 60°C (optional) and can be operated in a fully sealed configuration.
Product Manager, Dr. Maarten Rutgers, commented, “We developed the EC Cell in collaboration with Prof. Richard Compton of the University of Oxford (UK) to conduct electrochemical experiments and, simultaneously, develop images of the changes occurring to the sample. This new tool is already saving researchers a considerable amount of time and, additionally, allows observation of many processes as they occur.”
March 7, 2011 - Asylum Research, the technology leader in scanning probe and atomic force microscopy (SPM/AFM), announces the Cypher AFM Scan Tour and Workshop will take place at the UCLA-CNSI’s Nano and Pico Characterization Laboratory on April 19-20, 2011. Each day’s agenda will include a presentation of Cypher’s unique features and allow attendees to “look inside the box” and really get to grips with Cypher’s revolutionary design. Attendees are invited to bring their samples for individual demonstrations of Cypher in real-time, and to experience the unique capabilities of the world’s highest resolution AFM, including closed loop atomic resolution, fast scanning, and advanced ease-of-use features such as SpotOn™ automatic laser and photodiode alignment. Three slots will be available each day for attending groups to assess their own samples using their scanning modes of choice. Registration is free and all interested parties are welcome. Attendance is limited so early registration is recommended. Attendees may register at www.AsylumResearch.com/Events/CATour/
John Green, Executive Vice President of Sales at Asylum Research commented, “We are very pleased that the California NanoSystems Institute (CNSI) at UCLA will be the first stop on our Cypher California Tour this year. The Nano and Pico Characterization Laboratory is a renowned center providing state-of-the-art research tools and experienced scientist support for its multitude of users and collaborators in the nanoscience community. This workshop will introduce researchers to the advanced capabilities th at Cypher can bring to their research, especially in the dynamic and growing fields of energy storage, polymer materials, and single molecule studies.”
Adam Stieg, Scientific Director of the Nano and Pico Characterization Laboratory (NPC) at UCLA-CNSI, noted “The NPC Lab and CNSI are extremely excited to be a host for Asylum’s 2011 Cypher California Tour. Workshops of this kind provide an extremely valuable opportunity for researchers to gain hands-on experience in the characterization of real samples that would not be possible in other venues. Given the breadth of the scientific community here at UCLA, this extended workshop will serve to expose researchers to the advantages provided by AFM methods in the execution of cutting-edge nanoscience research.”
About UCLA’s CNSI Nano and Pico Characterization Lab
The Nano & Pico Characterization Lab provides both state-of-the-art microscopic techniques to visualize surfaces, adsorbates, nanostructures and devices at the atomic and molecular scale as well as a unique opportunity for researchers to gain insight into local properties under a wide range of experimental conditions. An ever increasing demand for knowledge of how matter behaves at the nanoscale and beyond has forced these measurements and methods to the forefront of nanoscience research.
For additional information, contact Terry Mehr, Director of Marketing Communications, Asylum Research, 6310 Hollister Avenue, Santa Barbara, CA 93117, 805-696-6466x224, terry@AsylumResearch.com, www.AsylumResearch.com.
March 3, 2011 - Asylum Research, the technology leader in scanning probe and atomic force microscopy (SPM/AFM), announces the continuation of the Cypher AFM Scan Tour that will take place at the University of Southampton, March 29-31, and University College Dublin, April 5-7. Each day’s agenda will include a presentation of Cypher’s unique features and allow attendees to “look inside the box” and really get to grips with Cypher’s revolutionary design. Attendees are invited to bring their samples for individual demonstrations of Cypher in real-time, and to experience the unique capabilities of the world’s highest resolution AFM, including closed loop atomic resolution, fast scanning, and advanced ease-of-use features such as SpotOn™ automatic laser and photodiode alignment. Three slots will be available each day for attending groups to assess their own samples using their scanning modes of choice. Please contact Chris Mulcahy for additional information (+44(0)1869 255775, firstname.lastname@example.org) or go to www.AsylumResearch.com/UKTour/ to register. Registration is free and all interested parties are welcome. Attendance is limited so early registration is recommended.
Dr. Chris Mulcahy, Managing Director of Asylum Research UK Ltd. Commented, “We are thrilled to be taking to the road again with Cypher in Southampton and at UCD, Ireland. Our Tour last autumn was very well received with many scientists captivated by Cypher’s fast scanning, ease-of-use and superior closed-loop resolution, imaging and measurement accuracy. We can’t wait to impress more of our region’s AFM users on this second set of tour dates.”
Added Dr. Laurent Bozec of the London Centre for Nanotechnology (LCN), “We were delighted to host a team of researchers from Asylum Research to the LCN in London to demonstrate the capabilities of their new Cypher atomic force microscope. During this three-day event, our researchers had the chance to try this new high resolution microscope and were left with a very positive experience. I believe Cypher is one of if not the best high performance AFM on the market. It shines by its combination of high-resolution and ease of use.”
February 22, 2011 - The new book, “Scanning Probe Microscopy of Functional Materials,” edited by Dr. Sergei Kalinin of the Oak Ridge National Laboratory and Alexei Gruverman of the University of Nebraska, describes cutting-edge nanoscale imaging and spectroscopy advances in the field of atomic force/scanning probe microscopy. The volume includes 18 articles by leading university, U.S. government, and industry researchers, including three authored or co-authored by Dr. Roger Proksch of Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM). Recent research has produced remarkable progress in the development of scanning probe microscopy and this new book is expected to become a seminal work in the field.
Commented author and President of Asylum Research, Roger Proksch, "This new book includes papers on a broad range of new techniques that extend the functionality of SPMs and we think it is an excellent overview for readers interested in quickly getting up to speed on the latest developments. I am delighted to be an author on three of the chapters, which illustrate some of the exciting new capabilities we have incorporated into our MFP-3D™ and Cypher™ AFMs, including Band Excitation, Dual AC Resonance Tracking (DART), Piezoresponse Force Microscopy (PFM), and Ztherm™ modulated thermal analysis."
"SPM has truly become a key characterization tool, not just for selected scientific disciplines, but for the field of nanoscience and technology in general,” notes Alexei Gruverman, co-editor of the book and Associate Professor at the University of Nebraska-Lincoln. “This book presents a snapshot of the most advanced modes of this continuously evolving technique describing nanoscale studies of a variety of functional materials such as complex oxides, biopolymers, and semiconductors.”
"One of the central tasks of this book is to provide an overview of recent developments in emerging fields of SPM, such as nanoscale thermal analysis, band excitation, chemical imaging using mass-spectrometric detection, as well as exotic combinations of SPM and focused X-ray methods, to name a few," added Sergei Kalinin, co-editor of the book and Senior Staff Member at Oak Ridge Center for Nanophase materials. "The unique aspect of this book is a strong representation of the leading SPM companies with their cutting-edge research and SPM developments that are now becoming available in academic, government, and industrial labs as well as techniques just emerging in leading research labs worldwide."
February 17, 2011 - The Max Planck Institute for Polymer Research (MPI-P) and Asylum Research, the technology leader in scanning probe/atomic force microscopy (SPM/AFM), are co-organizing the 2nd International Workshop for Scanning Probe Microscopy for Energy Applications, to be held at the MPI-P in Mainz, Germany from June 8-10, 2011. Following the highly successful first conference with well over 100 attendees at the Oak Ridge National Laboratory in 2010, this 2nd Workshop will focus on sharing new and innovative research involving characterization of the microscopic mechanisms underpinning solar cell, battery, and fuel cell operations, and materials used for alternative energy applications at the nanometer to micron range. Recent advances/techniques in SPM/AFM used to characterized energy relevant materials and systems will also be addressed. The three-day meeting will include invited/contributed talks and a poster session. Equipment labs and tutorials will be held on the last day for demonstration of recently-developed dynamic and multi-spectral SPM modes using Asylum Research’s Cypher™ and MFP-3D™ SPM/AFMs. Abstracts are now being accepted for contributed talks and a poster session. Go to www.mpip-mainz.mpg.de/symposium/spm2011 for information on the agenda, abstract submission, and registration.
Rüdiger Berger of Max Planck Institute for Polymer Research commented, “I am happy that we can host the 2nd International Workshop on Scanning Probe Microscopy for Energy Applications at the Max Planck Institute for Polymer Research. Green energy is one of the most important current issues and we need multidisciplinary teamwork in this area to identify the best strategies. Surfaces and interfaces play a crucial role in solar cell devices and batteries. We are proud to bring together scientists from all over the world to discuss recent findings and to discuss ways to accelerate the development of green energy technologies.”
February 11, 2011 - Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM) announces its AFM in Biology Class to be held April 13-15, 2011 in Santa Barbara, California. The class is open to all Atomic Force Microscopy users that want to increase their knowledge of AFM in biology and life sciences. A high resolution imaging lab on the Cypher™ AFM, the world’s highest resolution AFM, has recently been added to the curriculum. This world-renowned class, now in its lucky 13th session, combines lecture with hands-on sessions for personal instruction and interaction with the Asylum technical staff.
“We cover all the essential AFM topics that biologists need and want to learn about – from sample preparation to advanced imaging and force measurements,” said Sophia Hohlbauch, Applications Scientist. “The breadth of AFM experience of our staff is unsurpassed – both our President and CEO participate and class attendees have access to all of our scientific staff. The class is fun, with a good mix of lecture and equipment time.”
Commented student Fettah Kosar, Technical Manager, Materials Facilities Center for Nanoscale Systems (CNS) Harvard University, “I recently attended the AFM in Biology Class with not much AFM experience and was skeptical about how much knowledge and experience I could gain in just three days. The class turned out to be way above my expectations. It was very well organized with classroom lectures balanced with hands-on exercises. There were never more than two students per microscope. The instructors were all experts in their fields and very approachable. The atmosphere at Asylum was relaxed and fun, making the class extremely enjoyable. Oh, I should also mention that they fed us really well!”
The three day course is held twice a year. Topics include sample prep, force measurements, and imaging on DNA, proteins, force measurements and mapping, lipids and imaging live cells. Hands-on labs will be done on the MFP-3D™ Stand Alone, MFP-3D-BIO™ and the Cypher AFM. Class size is limited. A PDF of the registration form can be downloaded from the Asylum Research web site at www.AsylumResearch.com/Events/BioClassRegistration.pdf.
February 1, 2011 - The Birck Nanotechnology Center (BNC) at Purdue University, in conjunction with Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM), will be hosting an Atomic Force Microscopy (AFM) Workshop on February 17, 2011. The Birck Nanotechnology Center hosts workshops for its constituents by aligning top tool developers and scientists to educate and train AFM users on state-of-art equipment located within its 187,000 square foot research facility. The workshop will include lectures and equipment/imaging demonstrations for both life science applications and electrical characterization of materials. Topics include AFM for biological applications, force measurements and mapping, combined AFM and optical imaging, cell imaging, and electrical characterization using conductive AFM. In addition, Purdue researchers Dr. Robert Moon, Assistant Professor of Materials Engineering, and Ryan Wagner, Graduate Student, will present a talk on force-displacement measurements.
“We are extremely pleased to be teaming with the Birck Nanotechnology Center for this workshop and its benefits are twofold – to support the continued education of AFM technology and applications to current researchers at the Center, as well as to introduce the technology to other scientists in and around the vicinity,” said John Green, EVP of Sales for Asylum Research. “Ground-breaking research in AFM, including work done in the Arvind Raman Group, certainly confirms Birck as a leading US nanotechnology center.”
When asked about the upcoming AFM workshop, Dr. Xin Xu, the scanning probe scientist in the Birck Center, said “The new bio-AFM facility built around Asylum's MFP-3D-BIO AFM has greatly improved Birck's scanning probe capability and has been an important step in promoting AFM use across Purdue's campus. I look forward to the workshop and hope it will convince others that the Birck Center is an important scanning probe asset."
The AFM Workshop will be held in Room 2001 at the BNC and is open to current AFM researchers looking to learn more about AFM techniques from Asylum and Purdue experts, as well as to those new to AFM that want to learn how AFM can be used in their own research. A small registration fee of $30 will be charged to cover lunch and coffee breaks. Additional information and registration for the workshop can be found at (www.conf.purdue.edu/atomic).
About Birck Nanotechnology Center at Purdue University
January 26, 2011 - Asylum Research, the technology leader in scanning probe/atomic force microscopy (AFM/SPM), is offering a Bimodal AFM Tutorial on March 13, 2011 in conjunction with the 3rd Multifrequency AFM Conference in Madrid, Spain, March 14-15. The Bimodal AFM Tutorial is free of charge to conference attendees that want to increase their knowledge of multifrequency techniques, including cantilever physics, materials contrast, bimodal imaging theory, simulation with VEDA, and future directions of the technique. Techniques will be demonstrated on AFM instrumentation. Guest lecturers include world-renowned researchers in the field: Arvind Raman of Purdue University, Elena T. Herruzo, Instituto de Microelectrónica de Madrid, CSIC, Garcia Lab, and Roger Proksch of Asylum Research.
“This tutorial is ideal for the researcher that wants to learn more about materials contrast through multifrequency techniques,” said Roger Proksch, President of Asylum Research. “AFM still faces numerous challenges to bring together molecular resolution imaging and quantification of material properties. Understanding higher harmonics and cantilever dynamics is clearly the next evolution of AFM that will take this research to a higher level.”
Commented Prof. Ricardo Garcia, Conference Chair, “In 2011 we will commemorate the 25th anniversary of the invention of the AFM. AFM has become one of the main pillars that sustain the advanced nanoscience and nanotechnology. However, the AFM still faces challenges to bring together molecular resolution imaging and quantification of material properties. The need for higher compositional resolution and sensitivity has led to an evolution from single to multifrequency excitation and detection schemes. The Multifrequency conference and the Biomodal Tutorial aim to bring together AFM experts and newcomers to share knowledge on the instrumentation and theoretical aspects of the next generation of advanced force microscopes.”
The afternoon tutorial will be held at the Ayre Gran Hotel in Colon, Spain, Multifrequency Conference headquarters. Registration for the Advanced Tutorial is limited to 15 people and will be based on a first-come, first-served basis. Additional information and registration can be found on the 3rd Multifrequency AFM Conference web site at http://www.imm.cnm.csic.es/spm/multifrequency/scope.html.
January 19, 2011 - Asylum Research, the technology leader for atomic force and scanning probe microscopy (AFM/SPM), announced today that its 2010 sales set a new record, besting its record-breaking 2009 by nearly 20%. The new record was fueled by increasing acceptance of Asylum’s Cypher™ Atomic Force Microscope, the world’s highest resolution AFM. Sales also accelerated for the MFP-3D-BIO™ AFM, which mounts on an inverted optical microscope platform for the biosciences, and for the versatile MFP-3D™ Stand Alone AFM for physical and materials science applications.
Commented John Green, Asylum Research Executive VP of Sales, “Sales growth at these levels in the present market for a second consecutive year is a tremendous achievement. The extra efforts of everyone in our worldwide organization contribute to this continued success. We also want to thank all our users who so eagerly spread the word and continue to drive us to maintain our preeminence as the technology leader in scanning probe and atomic force microscopy.”
Added Dr. Roger Proksch, Asylum Research President, “Our ongoing rapid growth is the result of the quality and performance of our existing and new products – not to mention the legendary product and applications support our people provide. Our introduction of the innovative new Cypher product line has continued our tradition of excellence. Instead of contenting ourselves with tweaking older products like other AFM companies, we invested to bring forth the first new small sample AFM in more than ten years.”