About |
Asylum Research
|
|
Asylum Announce List |
Press Releases |
Asylum Research Atomic Force Microscope Featured in CSI: Miami Episode
“I was really surprised when CSI: Miami producers called me to use our MFP-3D AFM,” said Terry Mehr, Director of Marketing. “Only days earlier, I had received an email from our VP of Asia Pacific telling me about a customer that was interested in doing forensics on our AFM and how great it would be to have our AFM on CSI. Then lo and behold, I get a call from the producers asking to use the equipment. It’s exciting to have our AFM featured in the episode.” While details of the CSI: Miami episode cannot be revealed, the MFP-3D AFM will be used as the forensic instrument of choice to procure information about a sample. New ARgyle Light ™ Software Application for Advanced 3D Rendering of Asylum Research AFM Images Asylum Research, a manufacturer of advanced atomic force microscopes (AFMs), announces ARgyle Light, a stand alone software application that allows advanced 3D rendering and data channel overlay in an easy-to-use interface. The application also allows users to easily share their image files outside the instrument’s IGOR Pro native operating environment. The application is exclusively for use with the MFP-3D™ AFM. “This stand alone application is an ideal tool for three dimensional rendering outside our normal instrument software,” said Bruce Wallace, developer of ARgyle Light. “ARgyle Light has all the advanced rendering capabilities found in the MFP-3D instrument software in an easy-to-use application. This tool allows images in our native file format to be shared amongst the scientific community for those that do not have access to the full installation of the instrument software. ” ARgyle Light is an OpenGL® application that easily installs on any Windows® 2000/XP/Vista-based computer. Once installed, users can open any Asylum Research data file that was created within the MFP-3D IGOR Pro environment. ARgyle Light will import all the channel data and parameters for offline image rendering and exporting. It has the same powerful rendering tools found in the native software for creating stunning AFM images with controls for scaling, viewing and lighting. The unique data channel overlay feature allows image data such as phase, amplitude or other channels to be overlaid on a second channel, such as the height, for data correlation. Viewing features include zoom capabilities, rotation, pitch and panning. Scaling of data for the Z axis includes range, offset and aspect ratio adjustment. Lighting and color capabilities provide spot lights, specular lighting controls, and all the color palettes that are available in the native version. In addition, image acquisition information can be viewed in a dialog box that lists all relevant scanning parameters. Stereo anaglyph support is provided to give the image depth projection for viewing with red/cyan 3D glasses. Images can be saved and exported in a variety of common graphic file formats such as TIFF, JPEG, PNG, or BMP. Specific channel data can also be exported in raw ASCII text for analysis in other third party software packages. ARgyle Light and MFP-3D are trademarks of Asylum Research. Windows is a registered trademark of Microsoft Corp. OpenGL is a registered trademark of SGI. Asylum Research Offers AFM in Biology Class April 30 to May 2, 2008 Asylum Research, a manufacturer of advanced atomic force microscopes (AFMs), announces its AFM in Biology Class which will be held April 30 to May 2, 2008 in Santa Barbara, California. The class is open to all Atomic Force Microscopy users that want to increase their knowledge of AFM in biology and life sciences. “We cover all the essential AFM topics that biologists need and want to learn about – from sample preparation to advanced imaging and force measurements,” said Dr. Irène Revenko, Applications Scientist and class director. “With our extensive hands-on sessions, biologists get a better understanding of operating the AFM. The class is fun, with a good mix of lecture and equipment time.” “This is one of the best AFM classes of its genre,” commented Dr. Bernard Lim, MD, PhD, Mayo Clinic. “There is almost a one to one ratio of instructor to student and one of the best features is the ample hands-on experience. Real experiments based on the problems participants brought to the course were conducted – very well organized.” The three day course, now in its eighth session, is held twice a year. Topics include force measurements, and imaging DNA, proteins, lipids and live cells. The Asylum Research MFP-3D AFM is used exclusively for the hands-on sessions. Class size is limited. A PDF of the registration form can be downloaded from the Asylum Research web site. Asylum Research Appoints New Managing Director for UK Office Asylum Research, a manufacturer of advanced atomic force microscopes (AFMs), has appointed Dr. Chris Mulcahy as Managing Director for Asylum Research UK. “We are very excited about adding Chris to our UK team”, said John Green, Vice President of Sales. “His extensive background in materials research and analysis will be a great asset to Asylum.” Dr. Mulcahy commented, “I am looking forward to working with some of the leading researchers in the AFM field. Asylum Research’s reputation as the technical leader in AFM innovation is unsurpassed and I’m very excited about joining the Asylum team.” Dr. Mulcahy received his PhD in surface physical chemistry from Imperial College London. He carried out post doctoral research in the field of organic molecular thin film growth. Prior to joining Asylum Research, Dr. Mulcahy held the position of Director of Sales and Marketing for Quantum Focus Instruments. Asylum Research UK distributes and supports AFMs and accessories manufactured by Asylum Research. Asylum Research UK is located in the Oxford Center for Innovation, Oxford. Asylum Research manufactures AFMs/ Scanning Probe Microscopes (SPM), for nanoscale science and technology. For additional information, please contact Terry Mehr, Director of Marketing, Asylum Research, 6310 Hollister Ave., Santa Barbara, CA 93117, 805-696-6466, terry@AsylumResearch.com, www.AsylumResearch.com. In the UK, contact Dr. Chris Mulcahy, Asylum Research UK, Oxford Center for Innovation, Mill Street, Oxford, OX2 0JX UK, phone 44 01865 812075, chris@asylumresearch.co.uk. Asylum Research Eliminates Half of Veeco Patent Claims Asylum Research, a premier manufacturer of atomic force microscopes, announced that the federal court in Los Angeles dismissed two of the five Veeco Instruments Inc. (NASDAQ: VECO) patents from the infringement lawsuit commenced by Veeco in September 2003 and that the judge’s summary judgment order (http://www.AsylumResearch.com/sj.pdf) cast a large shadow over their remaining patents. This action eliminates 6 of 13 patent claims that Veeco brought against Asylum while all Asylum claims against Veeco remain. The court’s ruling was issued in March of this year, but had remained under seal until recently when the court lifted the seal at Asylum’s request. At the same time the court set a March 2008 date for trial on the remaining issues of the suit. “The standards for ruling on summary judgment are incredibly high, yet the judge dismissed nearly half of Veeco’s claims,” said Dick Clark, co-founder and general counsel of Asylum Research. “We are eager to go to trial this March, as ordered by the court. We will prove we do not infringe the few remaining Veeco claims and that they do infringe the claims of our patent. We will also prove, following the lead of the court’s ruling, that each of the remaining Veeco patents is invalid for improper inventorship, among other reasons.” An electronic version of the judge’s opinion in the case, Veeco Instruments Inc., et al v. Asylum Research Corporation, CV 03-6682 SVW (USDC Central District California) is available online at http://www.AsylumResearch.com/sj.pdf New Piezo Force Microscopy Module Enables Electromechanical Measurements at the Nanoscale
Electromechanical coupling is one of the fundamental natural mechanisms underlying the functionality of many inorganic and macromolecular materials and is ubiquitous in biological systems. The emergence of ferroelectric and multiferroic non-volatile memories and data storage devices have stimulated the studies of electromechanically active materials at the nanoscale. In the last decade, piezoresponse force microscopy (PFM) has emerged as the preeminent tool for nanoscale imaging, spectroscopy, and manipulation of ferroelectric materials. In response to the growing applications of electromechanical imaging and spectroscopy, Asylum Research has developed the new Piezo Force Module which enables very high sensitivity, high bias, and crosstalk-free measurements of piezoelectrics, ferroelectrics, multiferroics, and biological systems. It is exclusively available for the MFP-3D™ Atomic Force Microscope. “Electromechanics and PFM is a growing area of research with studies ranging from data storage devices to MEMS to electromotor proteins and electrophysiology. Our Piezo Force Module uses a special high voltage accessory and advanced imaging modes to measure piezoresponse, even for the weakest piezoelectric materials,” said Dr. Roger Proksch, President and co-founder of Asylum Research. “We are extremely excited about the potential for advanced measurements in many different disciplines.” The Piezo Force Module is an MFP-3D accessory that enables high voltage PFM measurements and advanced imaging modes for characterizing the sample material. With the Piezo Force Module, a bias is applied to the AFM tip using proprietary electronics, a high voltage cantilever, and sample holder. The vertical and lateral response amplitude measures the local electromechanical activity of the surface, and the phase of the response yields information on the polarization direction. High probing voltages, up to +220 volts, can characterize even very weak piezo materials. Exclusive patent-pending imaging modes, dual frequency resonance tracking and band excitation, effectively use resonance enhancement in PFM and provide new information on local response and energy dissipation which cannot be obtained by standard AFM scanning modes. These techniques allow independent measurement of amplitude, resonant frequency, and Q-factor of the cantilever and overcome limitations of traditional sinusoidal cantilever excitation. The large frequency range (1kHz - 2MHz) of MFP-3D allows imaging both at the static condition, and effective use of several cantilever resonances and use of the inertial stiffening of the cantilever. Polarization dynamics can also be studied with the built-in spectroscopy modes that include single-point hysteresis loop measurements and switching spectroscopy mapping. These modes provide local measure of such parameters as coercive and nucleation biases, imprint, remanent response, and work of switching (area within the hysteresis loop), for correlation with local microstructure. Combined with the high-voltage module, these allow local polarization switching to be probed even in high-coercivity materials such as electro-optical single crystals. Pioneering research on PFM is currently being conducted at Oak Ridge National Laboratory at the Materials Science and Technology Division and Center for Nanophase Materials Sciences, in collaboration with Asylum Research (see Asylum Research press release dated March 28, 2007). Many of their latest results will be presented at the MRS Fall 2007 Meeting in Boston, MA. “The recent work that we have done in collaboration with Asylum is already producing ground-breaking results,” said Dr. Kalinin, Staff Scientist at ORNL. “The plethora of new and exciting electromechanical phenomena emerging on the nanoscale – from electric field induced phase transitions in ferroelectrics to electronic flexoelectricity and molecular electromotors – has been belied by the lack of capability to study them quantitatively and reproducibly. PFM is the technique that enables these studies. Eventually, the development of nanotechnology will require the capability not only to “think”, but to “act” on the nanoscale. PFM will pave the way for the understanding of electromechanical coupling mechanisms on the nanometer scale and development of the molecular electromechanical systems.” The Piezo Force Module will be introduced at the MRS Fall 2007 Meeting. Asylum Research Expands Operations in Taiwan Asylum Research, a manufacturer of advanced atomic force microscopes (AFMs) for nanotechnology research, has announced the formation of Asylum Research Technology Ltd. (ART), a subsidiary company that will distribute and support its AFM products in Taiwan. The new company, headquartered in Kaohsiung, will also be a resource and support center for Asylum Research in the Asia Pacific region. “We see this as an excellent opportunity to provide top-level local support for our existing and future customers in the Asia Pacific region,” said Dr. David Beck, Managing Director of ART. “In addition to sales and technical support, our facility can do most repairs, minimizing turnaround time for our customers.” “We are excited about our new presence in Taiwan,” said Jason Cleveland, CEO of Asylum Research. “Nanotechnology research and development is rapidly growing in the APAC region and there are many new opportunities for collaboration with scientists doing cutting edge research. This new office will be completely outfitted with our entire line of Asylum Research MFP-3D™ AFMs.” Dr. Beck has been appointed the Managing Director of the Taiwan company. He received his PhD in Physical Chemistry from the University of Southern California. Dr. Beck was formerly the East Coast Sales Manager for Asylum Research. Contact Information for Asylum Research Technology Ltd. New iDrive™ Atomic Force Microscopy Accessory Allows Simpler AFM Fluid Imaging
Asylum Research, a manufacturer of advanced Atomic Force Microscopes (AFMs), introduces the iDrive cantilever holder. This new microscope accessory simplifies AFM fluid imaging and allows auto-tuning of cantilevers in fluid. It is exclusively available for use with Asylum Research MFP-3D™ AFMs.
Asylum Research Announces Collaboration with the TARRC for Advanced AFM Polymer Studies Asylum Research, a premier manufacturer of atomic force microscopes (AFMs), has announced its collaboration with the UK-based TARRC (Tun Abdul Razak Research Centre) of the Malaysian Rubber Board to develop new capabilities for studying elastomers, including the effects of nanofillers, using AFM. TARRC recently purchased the Asylum Research MFP-3D™ AFM for nanoscale studies of polymers and rubber composites. “We are extremely pleased to be working with TARCC as a partner for polymer studies,” said Roger Proksch, President and co-founder of Asylum Research. “Preliminary work using our exclusive Dual AC™ imaging mode has already shown extremely interesting results in characterizing rubber composite materials.” Dr. Stuart Cook, Head of Advanced Materials Division at TARRC added, “The Asylum Research AFM was the natural choice for our research. Its proven performance and advanced imaging modes will allow us to more accurately characterize and measure the physical property changes in elastomer systems. We’re looking forward to working with the excellent group of Asylum Research scientists to advance our studies.”
About TARRC
Euro AFM Forum at University of Münster Focuses on Current Research in Atomic Force Microscopy Asylum Research, in conjunction with the University of Münster, CeNTech, and Atomic Force F&E, announces the Euro AFM Forum to be held at the University of Münster, Germany, Sept. 3-5. The Euro AFM Forum is a conference for AFM researchers to share the cutting-edge research being done specifically in the field of AFM/SPM. Conference registration is free and is open to anyone who is currently doing work in AFM or for those interested in learning more on the topic. The first full day of the Forum will include invited talks and submitted posters on a variety of AFM topics from bio to semiconductors. The second day will be a hands-on workshop that will consist of equipment demonstrations and lectures on such topics as fluid imaging, electrical characterization and new AFM imaging modes. Researchers may submit their posters for the conference as well as their AFM images for an image contest. Three winners will be selected to receive an iPod Nano for their winning image. “We are pleased to co-host this conference that will bring together many of the top AFM scientists that are doing such great research in this field,” said Dr. Tilman Schäffer, Scientist in the BioForce Group at the CeNTech, University of Münster. The event is co-sponsored by CeNTech, University of Münster, Atomic Force F&E and Asylum Research. Conference details and registration can be found on the official conference site at www.AsylumResearch.com/EuroForum. About CeNTech and University of Münster About Atomic Force F&E Asylum Research Announces Collaboration with the Institute of Microelectronics of Madrid (IMM) on Advanced AFM Cantilever Dynamics Asylum Research, a premier manufacturer of atomic force microscopes (AFMs), has announced its collaboration with Professor Ricardo Garcia’s lab in the Institute of Microelectronics of Madrid to further develop new techniques in the field of AFM cantilever dynamics, focusing on higher harmonic and multiple frequency measurement modes. The collaboration involves Asylum Research licensing intellectual property from the Spanish Council for Scientific Research (CSIC) and the joint development of advanced imaging techniques that allow new surface characterization of a variety of materials. “Research coming out of the Garcia lab on cantilever dynamics is unsurpassed,” said Dr. Roger Proksch, President and co-founder of Asylum Research. “His recent work dovetails perfectly into developments we have been pursuing with Dual AC mode™ where we have seen extremely interesting results by employing higher cantilever resonant modes. Combining our efforts will lead to rapid advances in AFM surface characterization using this powerful new imaging mode.” Professor Ricardo Garcia, head of the Nanolithography and Scanning Probe lab of the Institute of Microelectronics of Madrid commented, “We strongly believe that multiple frequency imaging techniques will provide the next wave of AFM material characterization. It makes great sense for us to formally unite our efforts with Asylum Research because our conceptual developments can be readily implemented into their innovative MFP-3D™ AFM. We are confident that our joint efforts will benefit all AFM researchers and lead to the most rapid discoveries and dissemination of the technique.” Multiple-frequency imaging techniques have been pioneered in the Garcia lab and with the Asylum Research MFP-3D AFM using patent-pending Dual AC mode. In Dual AC mode, the cantilever is driven at two or more frequencies. The cantilever motion is then analyzed by the advanced MFP-3D digital controller. The amplitude, phase and other mechanical parameters can be displayed, saved, combined with other signals, and used in user-selected feedback loops. In comparison to ordinary AC mode data, Dual AC mode data shows increased contrast over a much wider range of imaging parameters and provides information on the frequency dependent mechanical properties of a surface. Alpha testing of Dual AC mode software has been very productive with publications submitted to prominent journals by various researchers. The beta release will occur on June 15th with an expected release version due later in the summer. About Instituto de Microelectrónica de Madrid Asylum Research Announces Collaboration with Oak Ridge National Laboratory
"We are extremely pleased to be working with cutting-edge AFM researchers at ORNL," said Dr. Roger Proksch, President and co-founder of Asylum Research. "The MFP-3D-BIO has uncompromised AFM performance on an inverted optical microscope platform. It will allow our collaborative research to move beyond the confines of traditional biological applications. The system has conductive AFM, nanolithography, a haptic interface for nanomanipulation, and many other measurement capabilities that traditionally have not been done on an inverted optical system. We are proud that ORNL has chosen the MFP-3D-BIO as the most technically advanced system for such research." Dr. Sergei Kalinin, former Wigner Fellow and now research staff at ORNL commented, "The MFP-3D system is equipped with a fast, highly flexible controller and high-bandwidth optical detection that facilitates integration with external data acquisition and processing electronics. These attributes, combined with new microscopy methods based on non-sinusoidal excitation signals recently developed at ORNL, open new pathways in previously untapped areas of energy dissipation measurements in materials and molecular systems. Novel magnetic-field assisted electromechanical imaging and spectroscopy modes will provide insight into the fundamental mechanisms of polarization switching and the role of defects and disorder on polarization and magnetization dynamics in ferroelectrics and multiferroics." Dr. Katya Seal has integrated the Asylum AFM with optical excitation at the Center for Nanophase Materials Science user center at ORNL. She adds, "The versatile optical access of the MFP-3D-BIO provides an ideal platform for the incorporation of electroluminescent and photo-induced voltage and current imaging - key techniques for progress in such high priority areas as solid state lightning and organic photovoltaics. We envision a system capable of probing the carrier generation and recombination processes on a single nanotube, nanowire, or grain level." The MFP-3D-BIO AFM has set the industry standard for advanced bioscience applications. Its low noise performance has made it the instrument of choice for combined AFM and optical techniques such as phase contrast, confocal, TIRF, etc. Easy fluid imaging and a variety of environmental accessories, including Petri dish holders, make it extremely versatile for advanced biological experiments. ARgyle™, advanced 3D image rendering and analysis software, allows separate channel data, i.e. fluorescence data and AFM topography, to be overlaid to correlate results. About Oak Ridge National Laboratory Asylum Research Acquires Majority Interest in its European Distributor Atomic Force F&E GmbH Asylum Research, a premier manufacturer of atomic force microscopes (AFMs), announced that it has purchased a majority interest of Atomic Force F&E GmbH. Atomic Force has been Asylum Research’s European distributor since 1999. “Our investment in Atomic Force solidifies our commitment to the European market,” said Jason Cleveland, CEO of Asylum Research. “Atomic Force has done an excellent job as our European distributor for the past eight years. This relationship will allow us to even better support our current and future customers with expedited service, and additional support and resources from the home office. With Atomic Force’s numerous years of AFM experience and their outstanding technical abilities, we’re proud to have them officially on the Asylum team.” Dr. Roland Goschke, Managing Director of Atomic Force F&E GmbH, commented, “Asylum Research’s investment in the European market shows its underlying commitment to nanoscience research which the company was founded upon. Cutting edge science and technology requires close interaction between the customer and instrument manufacturer. Asylum Research and Atomic Force are committed to deliver not only the most technically advanced instruments, but to work in collaboration with our customer’s research and be a conduit to their success. Together we will be able to further develop our strengths and be a reliable partner within the nanotechnology community.” About Atomic Force AFM in Biology Class, May 9-11, 2007 Back by popular demand, Asylum Research announces the AFM in Biology Class. This comprehensive class, taught by Dr. Iréne Revenko, and our staff of leading AFM biologists, is open to all AFM scientists that wish to expand their AFM knowledge as it pertains to life science applications. The three day training class will be tailored to the participants attending and will include lectures and hands-on equipment on the following topics: • Basic AFM operation (as demonstrated on the MFP-3D-SA and MFP-3D-BIO AFM Systems) There are a limited number of spots available and the class tends to fill very quickly. Interested participants may download the registration/information packet. Please email terry@asylumresearch.com should you need any additional information on the class. New Extended 40µm Z Range Scan Head Asylum Research announces the availability of a new MFP-3D Extended Head for use in its MFP-3D Atomic Force Microscopy (AFM) Systems. The new head design now allows a 40µm scan range in Z for samples with higher features, and in particular, for bioscience applications including living cells, plant imaging, and for pulling on long chained molecules. The MFP-3D Extended Head utilizes the same Nanopositioning System (NPS™) sensors found in the standard head for unprecedented precision and accuracy, low noise, and image clarity. Z Sensor noise is <0.3nm Adev in a 0.1 Hz-1 kHz bandwidth (BW) and sensor non-linearity less than 0.2% (Adev/full travel) at full scan; Z height noise <0.06nm Adev, 0.1 Hz-1kHz BW. Current customers that wish to upgrade their MFP-3D head should contact us at support@asylumresearch.com. Asylum Research Announces Appeal in European Opposition to Veeco Patent Asylum Research, a premier manufacturer of atomic force microscopes (AFMs), announced today that it will appeal a decision of the Opposition Division of the European Patent Office rejecting its opposition to a Veeco Instruments Inc. (VECO:NASDQ) European patent for tapping with phase imaging. Asylum Research filed its opposition in May 2004 on the grounds that the patent is invalid. The EPO does not consider infringement issues. “We are obviously disappointed with the decision, but it is one that was not unexpected since the three patent examiners (judges are not used) hearing this opposition included the examiner who originally granted the patent—as is normal. We expect a more balanced treatment from the appeals board where a large percentage of opposed patents are overturned or significantly limited in scope,” said Dick Clark, co-founder and CFO of Asylum Research. Roger Proksch, co-founder and President of Asylum Research, commented, “In 2003, faced with numerous high profile sales lost to our MFP-3D™, Veeco had a choice to make – innovate or litigate. Unfortunately, they chose litigation. This choice forced us to engage in the European opposition and to counter sue Veeco in the US. We founded our company to provide the world’s best, most innovative AFM instrumentation. The steadily increasing sales of the MFP-3D at prices comparable to Veeco’s AFMs is a testimony to the success we have had in carrying out this mission. We couldn’t do that if we copied Veeco’s intellectual property.” Asylum Research Announces MFM Cantilever Reseller Agreement with SmartTip Asylum Research has announced an agreement with SmartTip to resell their SmartCoat (SC) magnetic force microscopy (MFM) cantilevers in the US and Canada. “We are pleased to add the SC cantilever model to our growing list of cantilevers,” said Hector Cavazos, Manager of MEMs and Probe Development. “We now offer a more comprehensive cantilever line for MFM applications.” The SC cantilevers have a magnetic coating that is applied on the two steepest facets of the four-sided tip pyramid, leaving the other facets and cantilever uncoated. Because the two steep facets reduce to one facet at the tip apex, the effective tip is a unidirectional magnetic film with a field that is perpendicular to the sample. The result is a probe that offers a repeatable and well-defined stable magnetic state at the tip apex and allows for very high magnetic resolution with improved AFM resolution compared to a 'standard' MFM probe. About SmartTip MFP-3D AFM Installed at European Synchrotron Radiation Facility in Grenoble Asylum Research, a premier manufacturer of scanning probe/atomic force microscopes, has announced the installation of the MFP-3D Atomic Force Microscopy System at the European Synchrotron Radiation Facility (ESRF) in Grenoble France. The MFP-3D System, a high precision AFM, and the first system to be installed at ESRF, will be used in the Surface Science Laboratory for both biological and hard condensed matter analysis applications. “The ESRF Surface Science Laboratory provides users and staff with the most advanced and efficient tools for characterizing nanostructures. For many years the efforts have been dedicated to solid state physics and have resulted in the combination of local probe microscopies with X-ray characterization. In view of extending this to soft condensed matter and biology, the laboratory has selected the Asylum Research MFP-3D as the instrument to be associated with synchrotron X-ray analysis. The advanced operation, flexibility and open architecture of the MFP-3D will also help further the development of instruments more specifically dedicated to the X-ray environment,” said Fabio Comin, Director of ESRF Surface Science Laboratory. “We are extremely excited that ESRF has selected the MFP-3D as the instrument of choice for their research,” said Dr. Iréne Revenko, Biology Applications Scientist. “Our dedication to providing the most technically advanced instrumentation has been confirmed by ESRF’s instrument selection. We look forward to collaborating and supporting their efforts in this exciting field of research.” The MFP-3D AFM offers unprecedented, precision and accuracy for measuring many different samples. It has set the industry standard for advanced operation, control and flexibility. About ESRF About Asylum Research and its European Distributor, Atomic Force F&E Asylum Research Opens East Coast Sales, Applications and Support Office Asylum Research, a premier manufacturer of scanning probe/atomic force microscopes, has announced the opening of its East Coast sales, applications and support office at the North Carolina State University (NCSU) Centennial Campus. “We are excited about our new location at NCSU,” said Jason Cleveland, CEO of Asylum Research. “Not only will it allow us to be closer to all of our East Coast customers, but there is a lot of nanoscience research at both the University and industry level in Research Triangle Park. Researchers will have easy access to the latest and most advanced AFM technology right in their own backyard.” The new location will be outfitted with a complete line of MFP-3D™ AFM systems for customer demonstrations. A grand opening ceremony is planned for late October. Those wishing to tour the facility or attend the reception may contact the office for additional details at 919-861-7420. East Coast Office Contact Information Asylum Research Expands Operations in the UK “We are excited about our new presence in the UK and Ireland ”, said Jason Cleveland, CEO of Asylum Research. “AFM is growing in the region and we want to be there to support our current and future customers. The office will be completely outfitted with our entire line of Asylum Research MFP-3D AFMs.” Dr. Shelley Wilkins has been appointed Managing Director for the UK company. Dr. Wilkins received her PhD from Oxford University and holds a degree in Physical and Theoretical Chemistry. She has been published in numerous international science journals for her AFM work and was recently the Business Development Manager at Windsor Scientific. Asylum Research Announces New Dual AC™ Imaging Mode for Atomic Force Microscopy “Dual AC mode is a leap forward in characterizing materials in both air and liquid,” said Roger Proksch, President of Asylum Research. “Unlike phase imaging which typically requires a choice of setpoint and drive amplitude to maximize the phase contrast, Dual AC mode shows increased contrast over a much wider range of imaging parameters. It also provides information on the frequency dependent mechanical properties of a surface. Because of the pioneering all-digital nature of our MFP-3D controller, Dual AC mode was added without any hardware modifications and is available to all current MFP-3D users. It is a perfect example of how going digital allows us to bring cutting edge improvements to our customers without costly hardware upgrades.” In Dual AC mode, the cantilever is driven at or near two or more of its resonance frequencies.The cantilever motion is then analyzed by two quadrature digital lock-in amplifiers. The output of the lock-ins can be displayed, saved, combined with other signals, and used in user-selected feedback loops. Dual AC mode shows strikingly different contrast from the fundamental amplitude and phase signals that are used in AC imaging mode. In this 10µm scan made of graphite, “A” is the height image, “B” is the fundamental amplitude, “C” is the fundamental phase, and “D” is the second mode (Dual AC mode) amplitude image. The second mode amplitude shows striking contrast not visible in the other channels. For additional information, see the paper "Multiple-frequency, repulsive-mode amplitude-modulated atomic force microscopy," R. Proksch, Applied Physics Letters 89, 113121 (2006). Asylum Research Announces New NanoIndenter™ Module for the MFP-3D AFM Asylum Research announces the availability of the new NanoIndenter module for use with its MFP-3D AFM System. The NanoIndenter is the first commercially available product to bridge the gap between conventional nanoindenters and AFMs. Unlike cantilever-based nanoindenters (AFMs), the NanoIndenter drives the nanoindenting tip perpendicular to the sample. And unlike conventional nanoindenters, tip displacement and force are measured with the MFP-3D AFM’s optical detector and the patent-pending NPS™ Nanopositioning sensors. This combination results in exquisite force and positioning sensitivity. This allows repeatable imaging, quantitative feature measurement, reliable and accurate imaging offsets, quantitative force curves, and incredibly precise positioning for manipulation and lithography. “Because the NanoIndenter is truly integrated with the premier metrology AFM, the MFP-3D, the user can measure forces and displacements with near AFM precision while avoiding the non-orthogonality issues that plague cantilever-based indentation measurements. This integration means that users can easily image the indenter tip itself and characterize its shape,” said Flavio Bonilla, Product Manager for the NanoIndenter. “The software scripting ability native to the MFP-3D environment also makes this product ideal for scientists automating measurements or working on new ways of characterizing materials.” The NanoIndenter easily fits on the MFP-3D AFM head for easy viewing of the sample. It is available in two models, Standard and Low Force. The module comes with three standard sample mounts, small, medium and large. Measurements and surface characterization can be done on many different materials including thin films, coatings, polymers, etc. The NanoIndenter is ideal for a variety of applications including the elastic and inelastic behavior of materials; dislocation phenomena; fractures in ceramics; mechanical behavior of metals, thin films, ceramics, bone, biomaterials, residual stresses; and time dependent mechanical characteristics in soft metals and polymers. Asylum Research Licenses Magnetic Actuated Cantilever Technology SANTA BARBARA, CA--October 21, 2005--Asylum Research announces an exclusive licensing agreement with the Institut Curie of Paris for their Atomic Force Micoscope (AFM) patent on magnetic actuated cantilever technology. The license agreement covers use in US and European markets. The cantilevers are actuated by driving a tiny oscillating current through the legs of the cantilever. In a magnetic field, even one as small as the earth's, this oscillating current results in an actuation force, directly driving the cantilever. "This licensing agreement will add another powerful capability for imaging samples with our MFP-3D(TM) instruments, particularly in fluid," said Dr. Roger Proksch, president of Asylum Research. "This new technology overcomes serious limitations of other magnetically actuated techniques that require magnetic coated cantilevers. The quality of the magnetic film coating is unreliable and may corrupt an experiment with unwanted metal (Fe, Ni or Co) ions." Magnetically actuated cantilever technology allows non-destructive atomic force microscopy of sensitive samples, particularly for imaging bioscience and polymer samples in fluid. Asylum Research manufactures advanced scientific instrumentation, including AFMs/ Scanning Probe Microscopes (SPMs), for nanoscale science and technology. An AFM/SPM is one of the premier instruments used for measuring surfaces and surface properties at the nanometer level. The Institut Curie is a private foundation headquartered in Paris, France, and is focused on fighting cancer. In addition to their research activities, they are also a hospital. Variable Field Module for Magnetic Applications
The VFM features adjustable pole tips that allow the maximum value of the applied field to be increased or decreased. This module uses a unique design incorporating rare earth magnets to produce the magnetic field so there is no heating or drift as the field changes. The field intensity is easily controlled through the software interface. Digital Access Module Accessory PALO ALTO and SANTA BARBARA, Calif., July 18, 2005 --- Agilent Technologies Inc. (NYSE: A) and Asylum Research have signed a joint development agreement to collaborate on technologies and applications in the area of nanotechnology measurements. Agilent is also making an equity investment in the Santa Barbara-based company. Terms of the agreement have not been disclosed. Agilent's Nanotechnology Measurements Division (NMD), part of the company's test and measurement business, is focused on the development of tools for the growing nanotechnology market. Asylum Research is a recognized leader in the development of Atomic Force Microscopes (AFMs), the principal measurement tools used by researchers working in nanotechnology. AFMs are used to measure the shape and properties of materials at the nanometer scale, and can also move particles and molecules from one position to another. The agreement announced today will allow Agilent's NMD to begin developing new features for AFMs as well as gain more knowledge about AFM technologies and customer needs. It will also enable the companies to jointly develop techniques and applications by leveraging the technologies and strengths of each organization. "The joint development agreement underscores our commitment to new technologies and markets," said Bob Burns, vice president and general manager of Agilent's NMD. "The AFM market is a significant portion of the $1 billion market for nanotechnology measurement tools, with the segment growing at close to 20 percent a year." "We expect this collaboration to result in applications development and new measurements for atomic force microscopy," said Dr. Roger Proksch, president of Asylum. "The partnership will allow each company to leverage its strengths, which include measurement science, optics, biotechnology and micromechanics. We look forward to our association with Agilent and the exciting possibilities ahead." About Asylum Research Asylum Research is an employee-owned company that manufactures advanced scientific instrumentation, including AFMs/Scanning Probe Microscopes (SPMs), for nanoscale science and technology. Asylum, founded in 1999, is based in Santa Barbara, California. Information about Asylum is available on the Web at www.AsylumResearch.com. About Agilent Technologies Agilent Technologies Inc. (NYSE: A) is the world's premier measurement company and a technology leader in communications, electronics, life sciences and chemical analysis. The company's 28,000 employees serve customers in more than 110 countries. Agilent had net revenue of $7.2 billion in fiscal year 2004. Information about Agilent is available on the Web at www.agilent.com . Forward-Looking Statements This news release contains forward-looking statements as defined in the Securities Exchange Act of 1934 and is subject to the safe harbors created therein. The forward-looking statements contained herein include, but are not limited to, information regarding Agilent's ability to develop new features for Atomic Force Microscopes and the ability of Agilent and Asylum Research to jointly develop techniques, applications and measurements that involve risks and uncertainties that could cause Agilent's results to differ materially from management's current expectations. Such risks and uncertainties include, but are not limited to risks associated with changes in demand for applications and technologies in the area of nanotechnology measurements. In addition, other risks that Agilent faces in running its operations include the ability to execute successfully through business cycles while it continues to implement cost reductions; the ability to meet and achieve the benefits of its cost-reduction goals and otherwise successfully adapt its cost structures to continuing changes in business conditions; ongoing competitive, pricing and gross margin pressures; the risk that our cost-cutting initiatives will impair our ability to develop products and remain competitive and to operate effectively; the impact of geopolitical uncertainties on our markets and our ability to conduct business; the ability to improve asset performance to adapt to changes in demand; the ability to successfully introduce new products at the right time, price and mix and other risks detailed in Agilent's filings with the Securities and Exchange Commission, including our Annual Report on Form 10-K for the year ended Oct. 31, 2004, and our Quarterly Report on Form 10-Q for the period ended April 30, 2005. Forward-looking statements are based on the belief and assumptions of Agilent's management and on currently available information. Agilent undertakes no responsibility to publicly update or revise any forward-looking statement. NOTE TO EDITORS: Further technology, corporate citizenship and executive news is available on the Agilent news site at www.agilent.com/go/news Janet Smith, Agilent Terry Mehr, Asylum Research New MFP-3D Extended Head for Bioscience Samples SANTA BARBARA, CA--May 17, 2005--Asylum Research announces the availability of the new MFP-3D Extended Head for use in its MFP-3D Atomic Force Microscopy (AFM) Systems. The new head design allows a 28µm scan range in Z for samples with higher features, and in particular, for bioscience applications including living cells and plant imaging. The MFP-3D Extended Head utilizes the same Nanopositioning System (NPS(TM)) sensors found in the standard head for unprecedented precision and accuracy. Z Sensor noise is <0.3nm Adev in a 0.1 Hz-1 kHz bandwidth (BW) and sensor non-linearity less than 0.2% (Adev/full travel) at full scan; Z height noise <0.06nm Adev, 0.1 Hz-1kHz BW. The Extended Head contains an extra piezo stack that enables the increased scan range in the Z axis. The MFP-3D Extended Head is offered as an option to MFP-3D system configurations. Current MFP-3D customers may retrofit their MFP-3D standard head. Please contact Asylum Research at sales@AsylumResearch.com for pricing and details. AFM in Biology Class, May 18-20, 2005 SANTA BARBARA, CA--April 13, 2005--Back by popular demand, Asylum Research announces the "AFM in Biology" training class. This comprehensive class, taught by Dr. Irene Revenko, is open to all AFM scientists that wish to expand their AFM knowledge as it pertains to life science applications. The three day training class will be tailored to the participants attending and will include lectures and hands-on equipment on the following topics: • Basic AFM operation (as demonstrated on the MFP-3D AFM) Interested participants may contact Asylum Research at 805-696-6466, or download the information packet. New ORCA™ Conductive AFM Imaging Module Now Available SANTA BARBARA, CA--June 3, 2004--Asylum Research, a manufacturer of atomic force microscopes (AFMs), introduces a new module, ORCA, for conductive AFM measurements using the MFP-3D(TM) AFM System. Conductive AFM is a powerful current-sensing technique for electrical characterization of conductivity variations in resistive samples. ORCA allows current measurements in the range of hundreds of femtoamps to nearly a microamp, and provides a wide range of current measurement options with near Johnson Noise-limited performance. The ORCA module consists of a specially designed cantilever holder that includes a transimpedance amplifier. The user can choose the gain of the amplifier. Standard values range from 5x10 7 to 5x10 9 volts/amp. The cantilever holder is used with conductive AFM probes to make the measurement. ORCA is ideal for characterizing a variety of materials such as dielectric films, ferro-electric films, nanotubes, or conductive polymers (see image example). SANTA BARBARA, CA--May 16, 2004--Asylum Research, a manufacturer of atomic force microscopes (AFMs), filed its opposition to a Veeco Instruments (Nasdaq: VECO) patent in Europe last week. The patent is the European version of one of the patents involved in the lawsuit initiated by Veeco against Asylum Research last September. Because of European patent procedures, the patent at issue, titled Tapping AFM with Phase Detection, has only recently been exposed for opposition. "We believe this patent is invalid, not only for the reasons we have already given to Veeco in the US, but also for a number of other reasons important under European law," said Dr. Roger Proksch, Asylum Research's President. "These reasons parallel those that led us to contend Veeco practiced fraud on the US Patent Office." "We continue to believe the Veeco lawsuit is an attempt to stop competition and deprive the AFM market of leading edge products," added Dr. Proksch, "and, as with this opposition in Europe, we will respond in every appropriate manner at our disposal." Asylum Research manufactures advanced scientific instrumentation, including AFMs/ Scanning Probe Microscopes (SPMs), for nanoscale science and technology. (An AFM/SPM is one of the premier instruments used for measuring surfaces and surface properties at the nanometer level). For additional information, please contact Terry Mehr, Director of Marketing, Asylum Research, 341 Bollay, Santa Barbara, CA 93117, 805-685-7077, terry@AsylumResearch.com. Asylum Research Files Counterclaims in Veeco Patent Suit "We are counterclaiming for infringement of a patent that we license from the University of California and that I am an inventor on which will permit the MFP-3D AFM to operate faster," said Dr. Jason Cleveland, Asylum Research's Chairman. "We are also suing Veeco for not continuing to pay the royalties they owe us for developing a hardware and software module that permits Veeco AFMs to operate more accurately, and is an integral part of their newest AFM controller, the NanoScope® IV. Overall, we believe the Veeco lawsuit is an attempt to stop competition and deprive the AFM market of leading edge products." Asylum Research manufactures advanced scientific instrumentation, including AFMs/ Scanning Probe Microscopes (SPMs), for nanoscale science and technology. (An AFM/SPM is one of the premier instruments used for measuring surfaces and surface properties at the nanometer level). For additional information, please contact Terry Mehr, Director of Marketing, Asylum Research, 341 Bollay, Santa Barbara, CA 93117, 805-685-7077, terry@AsylumResearch.com . New Digital Q Control for the MFP-3D This advanced feature is currently shipping with all MFP-3D systems, and is available as a simple software upgrade for MFP-3D customers. For more details, contact us at support@AsylumResearch.com. New BioHeater for Thermal Experiments with the MFP-3D
The BioHeater consists of a closed fluid cell that mounts inside a thermal heating element which symmetrically heats the sample. The fluid cell is sealed on both the top and bottom and has three fluid exchange ports for fluid, gas and electrical access to the sample. Only quartz, Kel-F and a membrane are in contact with the fluid. This allows easy cleaning and minimal sample contamination. The BioHeater features closed loop temperature control of the sample to within 0.1° C in a steady state, and less than 0.5° C overshoot. The temperature is controlled from within the MFP-3D software environment allowing coordination of heating events with other imaging, force measurement or lithography functions. The BioHeater easily mounts on the MFP-3D scanning stage and is compatible with all MFP-3D base models and can be used in both top view and bottom view modes. It supports samples up to 1mm thick. Asylum Research Strongly Denies Patent Infringement "It is currently hard to comment specifically on this announcement since we have not been officially notified of this lawsuit. We just only found out about it today from calls from the media," said Dick Clark, Asylum Research Chief Counsel. "Nonetheless, we feel that any patent infringement lawsuit is completely without merit. We plan to vigorously defend ourselves." "Our concern is mainly for our customers. This is just another step in Veeco's continuing march to monopolize the AFM marketplace. It began with Veeco's purchase of Digital Instruments, followed by the acquisition of IBM's AFM assets, and then the acquisition of ThermoMicroscopes, a division of Thermo Electron. We believe Veeco is now in the position of having about two-thirds of the worldwide AFM/SPM market, and 90% of the US market." New On-Sight MFP-3D Remote Training and Support Through the Internet "As far as we know, we are the first AFM manufacturer that is offering remote support through the web," said Mario Viani, Applications Scientist. "On-Sight' support is an incredibly powerful tool for training customers, customer support and trouble shooting systems in the field. We have already used it with great success with a few customers." We use a web-based, screen sharing program to view and control an AFM system in a remote location. The web-based system enables shared screen, mouse and keyboard control of the user's remote AFM. This easy and secure service works through firewalls and without the need for pre-installed client software. Typically, both the remote user and support team initially confer with a telephone call, then access their password-protected account through their web browser to make the connection. Once the connection has been made, remote system operation may be viewed on the host computer. Support scientists can easily talk customers through the critical operation of their AFM system, or actually control their system to assist the user. Asylum Research is currently offering this service, "On-Sight", free of charge with each MFP-3D AFM system. Image caption: Nanopore array fabricated by self-organized anodization in aluminum, 5µm scan. Sample courtesy of A. Janshoff, University of Mainz. |
|
Asylum Research •
6310 Hollister Ave. •
Santa Barbara, CA 93117 •
888-472-2795 •
805-696-6466 voice •
805-696-6444 fax •
info@AsylumResearch.com
|
May 1, 2008 (Santa Barbara, CA) Aside from performing cutting edge research in nanotechnology, the
Asylum Research MFP-3D AFM will be in the spotlight on the CBS hit television show CSI: Miami. The
AFM will be featured in the episode 619 “Rock and a Hard Place” scheduled to air May 5, 2008.
Current data taken with the MFP-3D AFM is being used to characterize a rubber composite, epoxidized natural rubber (ENR) and polybutadiene rubber BR as shown in the attached image. Silica-filled ENR is used in car tires to give lower rolling resistance which ultimately lowers fuel consumption, and also improves tire grip in wet conditions. Blends of ENR, a natural and renewable resource, along with other rubber compounds, are aimed at also improving other tire properties such as wear. In the 3µm image, a silica-filled blend of ENR-BR was scanned using Dual AC Mode, an exclusive imaging technique that uses the second mode, or higher frequency of AFM cantilevers, to characterize different material properties. The black dots correspond to silica particles, the yellow and orange patches to the ENR regions, and the purple and black to the BR regions. This differentiation is only apparent in the second mode phase image and is directly related to the local elasticity. 
Asylum Research, a premier manufacturer of atomic force microscopes (AFMs), announces an exclusive new imaging mode, Dual AC mode, that goes beyond conventional phase imaging in measuring the mechanical and chemical properties of samples by employing higher resonance modes of cantilevers. The patent-pending Dual AC mode is available only on the Asylum Research MFP-3D Atomic Force Microscope.
SANTA BARBARA, CA--October 3, 2005--Asylum Research announces the availability of the new 
SANTA BARBARA, CA--October 3, 2005--Asylum Research announces the new 
SANTA BARBARA, CA --Sept. 1, 2003-- Asylum Research announces the availability of "OnSight," remote AFM imaging capabilities through the Internet. Using an MFP-3D AFM System in the corporate headquarters in Santa Barbara, California, Asylum Research scientists can control an instrument installed at user facilities around the world. The image to the right was captured using "OnSight" at a user facility in Germany. 