Asylum Research

Galleries | Materials | PFM


PFM on BTO thin film

Piezoresponse Force Microscopy (PFM) phase image of an 8 nm thick BTO layer grown on a GaAs / Al0.3Ga0.7As heterojunction to make confined quantum wells. The sample was poled with a DC bias to create the pattern shown. Future experiments will use the polarized BTO to modulate the GaAs/Al0.3Ga0.7As/GaAs quantum well performance. Imaged on a Cypher S AFM. Scan size 10 µm. Image courtesy of Feng Bi and Giriraj Jnawali in Professor Jeremy Levy's group, University of Pittsburgh.


Oxford Instruments Asylum Research, Inc. • 6310 Hollister Ave. • Santa Barbara, CA  93117 •