Asylum Research

Galleries | Materials | PFM



AFM Topography (left), PFM amplitude overlaid on topography (middle) and PFM phase overlaid on topography (right) of an individual PVDF-TrFE nanomesa. 600nm scan. Imaged with the MFP-3D AFM.

Image courtesy of P. Sharma, T. Reece, S. Ducharme and A. Gruverman, University of Nebraska.


Oxford Instruments Asylum Research, Inc. • 6310 Hollister Ave. • Santa Barbara, CA  93117 •