Asylum Research

Galleries | Materials | Dual AC



Bimodal Dual AC 2nd mode amplitude overlaid on rendered AFM topography (left)
and fundamental phase image overlaid on topography (right) of multi-component surf wax.
Notice the high contrast visible in the bimodal Dual AC image and the relative
lack of contrast in the fundamental phase. 4µm scan. Imaged with the MFP-3D AFM.


Oxford Instruments Asylum Research, Inc. • 6310 Hollister Ave. • Santa Barbara, CA  93117 •