Asylum Research

Galleries | Materials | Conductive AFM (ORCA™)


Europium-doped ZnO

Topography (left) and current image (middle) of a Europium-doped ZnO sample at a bias of 1.5 volts, 2µm scan. Corresponding IV curves (right) recorded at three specific positions indicated in current image (middle).
The curves are consistent with the current contrast observed as well. Imaged with the MFP-3D AFM.

Sample courtesy of the Krishnan Lab, Univ. of Washington.


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