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Galleries | Cypher AFM Gallery


Repeated Point Defects

Successive AC mode topography images of the cleavage plane of a calcite crystal in water. The repeated
point defects demonstrate the true atomic resolution capabilities of the Cypher AFM. Arrows indicate
scan direction. Scan size 20nm; Z scale 3.2Å; Cantilever Amplitude 4Å; Cantilever Frequency 454 kHz.


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