Asylum Research

Galleries | 3D Anaglyphs

 

Phase Channel overlaid on Topography of SEBS, 2µm scan.

Phase channel overlaid on rendered topography of poly(styrene-(ethylene-r-butadiene)-styrene)
triblock copolymer (SEBS) spuncoat onto a silicon wafer.
Sample courtesy of R. Segalman and A. Hexemer, Kramer Group, UCSB.

Imaged with the MFP-3D AFM. This images was rendered using ARgyle,
the advanced 3D rendering feature found in the MFP-3D software face.

 


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