Asylum Research







Asylum Research and the Frederick Seitz Materials Research Laboratory at the University of Illinois Urbana Champaign (UIUC), announce the "Advanced AFM Workshop: New Techniques, Tips and Tricks for Improved AFM Measurements" on March 21-22, 2012. The workshop will combine instructional lectures and tutorial instrument demonstrations, as well as tips, tricks and new techniques in Atomic Force Microscopy. Topics will include electrical characterization (conductive AFM, SKPM, EFM), PFM, multifrequency techniques, new scanning techniques for nanomechanical characterization, and a tutorial on IGOR Pro software. UIUC researchers will also present current research on piezoresponse force microscopy (PFM), quantitative nanotube measurements, as well as combined AFM and Raman spectroscopy. In addition to UIUC personnel, the workshop is also open to all other researchers that want to learn more about these advanced AFM scanning techniques. All attendees must register.

March 21 Tentative Schedule

8:30am   Registration, Engineering Sciences Bldg (#174), Room 190
9:00 Bill Wilson, Scott MacLaren, UIUC Opening Remarks/ UIUC Lab Overview
9:20 Keith Jones,
Asylum Research
Electrical Characterization Techniques/Tips & Tricks: Conductive AFM, SKPM, EFM, PFM-DART/ ESM
10:15   Break
10:30 Kumar Virwani, IBM Invited Talk - Predicting Device Performance with Statistically Relevant Conducting AFM
11:15 Keith Jones
Instrument Demonstration: Electrical Characterization
12:15pm   Lunch
1:00 Anoop Damodoran,
Critical Factors for PFM and d33 Measurements
1:30 Keith Jones Instrument Demonstration: PFM
2:45   Break
3:00 Deron Walters
Asylum Research
Great Things Happen in the Lab with IGOR: Software Overview
3:30 Deron Walters ModeMaster and MacroBuilder IGOR Tools: Power and Flexibility for All Levels of Users
4:45   Wrap Up

March 22 Tentative Schedule

9:00am Julio Soares, Scott MacLaren, UIUC Preview: Combined AFM and Raman Spectroscopy
9:30 Jason Cleveland, Asylum Research Smaller, Quieter and Faster Ultra-high Resolution AFM with the Cypher AFM
10:15   Break
10:30 Jason Cleveland Instrument Demonstration: Ultra-high Resolution AFM
12:00pm   Lunch
1:00 Simon Dunham,
Critical Factors in Nanotube Measurement
1:30 Deron Walters Fazed by Phase Imaging: What is Phase Imaging and What Does it Mean
2:15 Keith Jones Scanning in Harmony: Multifrequency Techniques Including AM-FM Imaging for Nanomechanical Measurements
3:00   Break
3:15 Deron Walters Instrument Demonstration: Nanomechanical Measurements
4:30 Scott MacLaren Wrap Up


A small registration fee of $40 will be charged to all attendees to cover lunches and breaks. All attendees must register.

Register Now


The Advanced AFM Workshop will be held at University of Illinois Urbana-Champaign, Engineering Sciences Building (Bldg #174)

Engineering Sciences Building
Room 190
1101 West Springfield Avenue
Urbana, IL 61801

Driving Directions and Map


Asylum Research
Terry Mehr
888-472-1795- toll free
805-696-6466- voice

Materials Research Laboratory
Center for Microanalysis of Materials
University of Illinois at Urbana-Champaign
Julie ten Have or Scott MacLaren


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