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Scope
Schedule
Registration
Venue
Contact
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Asylum Research and the Frederick Seitz Materials Research Laboratory at the University of Illinois Urbana Champaign (UIUC), announce the "Advanced AFM Workshop: New Techniques, Tips and Tricks for Improved AFM Measurements" on March 21-22, 2012. The workshop will combine instructional lectures and tutorial instrument demonstrations, as well as tips, tricks and new techniques in Atomic Force Microscopy. Topics will include electrical characterization (conductive AFM, SKPM, EFM), PFM, multifrequency techniques, new scanning techniques for nanomechanical characterization, and a tutorial on IGOR Pro software. UIUC researchers will also present current research on piezoresponse force microscopy (PFM), quantitative nanotube measurements, as well as combined AFM and Raman spectroscopy. In addition to UIUC personnel, the workshop is also open to all other researchers that want to learn more about these advanced AFM scanning techniques. All attendees must register.
March 21 Tentative Schedule
| 8:30am |
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Registration, Engineering Sciences Bldg (#174), Room 190 |
| 9:00 |
Bill Wilson, Scott MacLaren, UIUC |
Opening Remarks/ UIUC Lab Overview |
| 9:20 |
Keith Jones,
Asylum Research |
Electrical Characterization Techniques/Tips & Tricks:
Conductive AFM, SKPM, EFM, PFM-DART/ ESM |
| 10:15 |
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Break |
| 10:30 |
Kumar Virwani, IBM |
Invited Talk - Predicting Device Performance with Statistically Relevant Conducting AFM |
| 11:15 |
Keith Jones
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Instrument Demonstration: Electrical Characterization |
| 12:15pm |
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Lunch |
| 1:00 |
Anoop Damodoran,
UIUC
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Critical Factors for PFM and d33 Measurements |
| 1:30 |
Keith Jones |
Instrument Demonstration: PFM |
| 2:45 |
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Break |
| 3:00 |
Deron Walters
Asylum Research |
Great Things Happen in the Lab with IGOR: Software Overview |
| 3:30 |
Deron Walters |
ModeMaster and MacroBuilder IGOR Tools: Power and Flexibility for All Levels of Users |
| 4:45 |
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Wrap Up |
March 22 Tentative Schedule
| 9:00am |
Julio Soares, Scott MacLaren, UIUC |
Preview: Combined AFM and Raman Spectroscopy |
| 9:30 |
Jason Cleveland, Asylum Research |
Smaller, Quieter and Faster Ultra-high Resolution
AFM with the Cypher AFM |
| 10:15 |
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Break |
| 10:30 |
Jason Cleveland |
Instrument Demonstration: Ultra-high Resolution AFM |
| 12:00pm |
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Lunch |
| 1:00 |
Simon Dunham,
UIUC
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Critical Factors in Nanotube Measurement |
| 1:30 |
Deron Walters |
Fazed by Phase Imaging: What is Phase Imaging and
What Does it Mean |
| 2:15 |
Keith Jones |
Scanning in Harmony: Multifrequency Techniques Including AM-FM Imaging for Nanomechanical Measurements |
| 3:00 |
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Break |
| 3:15 |
Deron Walters |
Instrument Demonstration: Nanomechanical Measurements |
| 4:30 |
Scott MacLaren |
Wrap Up |
Registration
A small registration fee of $40 will be charged to all attendees to cover lunches and breaks. All attendees must register.
Register Now
Venue
The Advanced AFM Workshop will be held at University of Illinois Urbana-Champaign, Engineering Sciences Building (Bldg #174)
UIUC
Engineering Sciences Building
Room 190
1101 West Springfield Avenue
Urbana, IL 61801
Driving Directions and Map
Contact
Asylum Research
Terry Mehr
888-472-1795- toll free
805-696-6466-
voice
www.AsylumResearch.com
UIUC
Materials Research Laboratory
Center for Microanalysis of Materials
University of Illinois at Urbana-Champaign
Julie ten Have or Scott MacLaren
217-333-1371
http://cmm.mrl.illinois.edu/
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