Overview of AFM Tools for Electrical Characterization
This application note briefly describes the operating principles and applications of four important AFM techniques that are used for electrical characterization:
- Electric Force Microscopy (EFM)
- Kelvin Probe Force Microscopy (KPFM, also known as surface potential imaging)
- Conductive AFM (CAFM, also known as current mapping)
- Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)
Download the Application Note
KPFM image of a carbon-impregnated polyolefin film, 3 µm scan. Image taken on the MFP-3D Infinity AFM.