Asylum Research

 

Contact Resonance
Viscoelastic Mapping Mode

Learn more from our Contact Resonance webinar

 

Asylum Research’s Contact Resonance Viscoelastic Mapping Mode option for the MFP-3D™ and Cypher™ S atomic force microscopes (AFMs) enables high resolution, quantitative imaging of both elastic storage modulus and viscoelastic loss modulus. It is just one of the many nanomechanical tools in Asylum’s NanomechPro™ Toolkit. The contact resonance technique is particularly well suited for characterizing moderate to high modulus materials in the range of about 1GPa to 200GPa. Thanks to recent advances by Asylum and our collaborators, Contact Resonance Viscoelastic Mapping Mode is now faster, more quantitative, and easier to use than earlier implementations.

 

 

 

Download Contact Resonance
Viscoelastic Mapping Mode Data Sheet
(1.8 MB)

Download our contact resonance article
from GIT Imaging and Microscopy (645 KB)

 

The contact resonance technique models the cantilever-sample contact as a Kelvin–Voigt mechanical equivalent, where a spring represents sample stiffness and a dashpot represents sample dissipation. The frequency of the contact resonance is proportional to sample stiffness and the quality factor of the contact resonance is proportional to the sample dissipation.

 


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