Asylum Research



General AFM/SPM Technology

AFM Characterization of Thin Films: High-Resolution Topography and Functional Properties


  Measuring Surface Roughness with Atomic Force Microscopy
  Low Noise Cantilevers for AC in Fluid and Force Measurements  
  AFM Equation Card
  Digital Q Control  
  Digital Lock-in
  Band Excitation Scanning Probe Microscopies  


Cantilever Calibration

  Bimodal Dual AC Mode        

Electrical Measurements


Scanning Microwave Impedance Microscopy (sMIM)
Nanoscale permittivity and conductivity mapping.

  Photoconductivity AFM of Organic Photovoltaics  
  SPM Techniques for Organic Photovoltaics
  Electrochemical Strain Microscopy of
Li-ion Conductive Materials for Energy Generation and Storage
  ORCA™ – Conductive AFM
Imaging Using the MFP-3D
  Overview of AFM Tools for Electrical Characterization  
  Graphene and other low-dimensional materials


AFM and Combined Optical Techniques


  Stretching DNA with the MFP-1D
  Drug Research  
  Titin Measurements with the MFP-1D
  Simultaneous AFM and Fluorescence Measurements with the MFP-3D  
  Bimodal Dual AC™ Imaging of Collagen Fiber Ultrastructure
  Simultaneous Atomic Force and Phase Contrast Microscopy  
  Crack Propagation in Bone
  Utilizing Atomic Force Microscopy in Food Research  
  blueDrive™ for Cypher
Photothermal excitation option for simpler, more stable, and more accurate tapping mode imaging in air and liquids


Contact Resonance Viscoelastic
Mapping Mode


The NanomechPro™ Toolkit: Nanomechanical AFM Techniques for Diverse Materials

  Force Spectroscopy of Oil Droplet


AFM Applications in Polymer Science and Engineering

  Copolymer Stretching        

Nanolithography and Nanomanipulation

Engineering Nanoelectronic Devices



AFM Automation with MacroBuilder™


Oxford Instruments Asylum Research, Inc. • 6310 Hollister Ave. • Santa Barbara, CA  93117 •