Asylum Research

 

Applications
General AFM/SPM Technology
  
 

Bimodal Dual AC Mode

 

  
  Measuring Surface Roughness with Atomic Force Microscopy
                 
   
  Low Noise Cantilevers for AC in Fluid and Force Measurements  
  AFM Equation Card
                 
   
  Digital Q Control  
  Digital Lock-in
                 
   
  Band Excitation Scanning Probe Microscopies  

 

Cantilever Calibration

Electrical Measurements

  
 

ORCA™ – Conductive AFM
Imaging Using the MFP-3D

 
 

Piezoresponse Force Microscopy

 
                 
   
  Photoconductivity AFM of Organic Photovoltaics  
  SPM Techniques for Organic Photovoltaics
                 
   
  Electrochemical Strain Microscopy of
Li-ion Conductive Materials for Energy Generation and Storage		  
 
Bioscience
  
 

AFM and Combined Optical Techniques

 

  
  Stretching DNA with the MFP-1D
                 
   
  Drug Research  
  Titin Measurements with the MFP-1D
                 
   
  Simultaneous AFM and Fluorescence Measurements with the MFP-3D  
  Bimodal Dual AC™ Imaging of Collagen Fiber Ultrastructure
                 
   
  Simultaneous Atomic Force and Phase Contrast Microscopy  
  Crack Propagation in Bone
                 
   
  Utilizing Atomic Force Microscopy in Food Research  
 
Nanomechanics
  
 

The NanomechPro™ Toolkit: Accurate Tools for Measuring Nanoscale Mechanical Properties for Diverse Materials

 
 
AM-FM Viscoelastic Mapping of Sample Mechanical Properties
                 
   
  Force Spectroscopy of Oil Droplet Interactions  
  Force Scanning with the MFP-3D™
AFMs: Two Capabilities In One
Polymers
  
 

Copolymer Stretching

  
 
Ztherm Modulated Thermal Analysis
Nanolithography and Nanomanipulation
  
 

Engineering Nanoelectronic Devices

  
 
MicroAngelo™ – Built-in Nanolithography and Manipulation
Software
  
 

AFM Automation with MacroBuilder™

  
 

Asylum Research • 6310 Hollister Ave. • Santa Barbara, CA 93117 • 888-472-2795 • 805-696-6466 voice • 805-696-6444 fax • info@AsylumResearch.com