Asylum Research

 

Applications


General AFM/SPM Technology
 
 

Bimodal Dual AC Mode

 

 
  Measuring Surface Roughness with Atomic Force Microscopy
                 
   
  Low Noise Cantilevers for AC in Fluid and Force Measurements  
  AFM Equation Card
                 
   
  Digital Q Control  
  Digital Lock-in
                 
   
  Band Excitation Scanning Probe Microscopies  

 

Cantilever Calibration


Electrical Measurements

 
 

Scanning Microwave Impedance Microscopy (sMIM)
Nanoscale permittivity and conductivity mapping.

 
 
                 
   
  Photoconductivity AFM of Organic Photovoltaics  
  SPM Techniques for Organic Photovoltaics
                 
   
  Electrochemical Strain Microscopy of
Li-ion Conductive Materials for Energy Generation and Storage
 
  ORCA™ – Conductive AFM
Imaging Using the MFP-3D

Bioscience
 
 

AFM and Combined Optical Techniques

 

 
  Stretching DNA with the MFP-1D
                 
   
  Drug Research  
  Titin Measurements with the MFP-1D
                 
   
  Simultaneous AFM and Fluorescence Measurements with the MFP-3D  
  Bimodal Dual AC™ Imaging of Collagen Fiber Ultrastructure
                 
   
  Simultaneous Atomic Force and Phase Contrast Microscopy  
  Crack Propagation in Bone
                 
   
  Utilizing Atomic Force Microscopy in Food Research  
 

Nanomechanics
 
Plantcellwall
 

Contact Resonance Viscoelastic
Mapping Mode

 
 
                 
 
 

The NanomechPro™ Toolkit: Accurate
Tools for Measuring Nanoscale
Mechanical Properties for Diverse
Materials

 
Force
 
                 
   
  Force Spectroscopy of Oil Droplet
Interactions
 
  MFP NanoIndenter for Combined AFM and Instrumented Nanoindentation

Polymers
 
 

Copolymer Stretching

 
 

Nanolithography and Nanomanipulation
 
 

Engineering Nanoelectronic Devices

 
 

Software
 
 

AFM Automation with MacroBuilder™

 
 

Asylum Research • 6310 Hollister Ave. • Santa Barbara, CA 93117 • 888-472-2795805-696-6466 voice • 805-696-6444 fax • info@AsylumResearch.com