Asylum Research

Cypher S

Not sure where to start? See our product line overview brochure.


Current News

News archives from December 2012 through December 2015

Data Sheets, Application Notes, Articles

AFM Tools for Nanoscale Electrical Characterization

AFM Characterization of Thin Films: High-Resolution Topography and Functional Properties

AFM Applications in Polymer Science and Engineering

Cypher ES Polymer Edition for polymer R&D research


Workshops, Talks and Tutorials

Materials Science and Engineering (MSE), Sept 27-29
“Quantitative measurements of electromechanical response with interferometric AFM”

Contact us to schedule a live demo at one of our upcoming shows! For additional details, see our events page.


Sign up to watch the recorded webinar: How to Choose the Right AFM Probe

More than Just Roughness: AFM Techniques for Thin Film Analysis

Beyond Topography: New Advances in AFM Characterization of Polymers

Piezoresponse Force Microscopy: From Theory to Advanced Applications: Two-part Webinar Series


Oxford Instruments Asylum Research, Inc. • 6310 Hollister Ave. • Santa Barbara, CA  93117 •


Cypher Cypher