Asylum Research

Cypher S

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Current News

Data Sheets, Application Notes, Articles

AFM Tools for Nanoscale Electrical Characterization

AFM Characterization of Thin Films: High-Resolution Topography and Functional Properties

AFM Applications in Polymer Science and Engineering

Cypher ES Polymer Edition for polymer R&D research


Workshops, Talks and Tutorials

Contact us to schedule a live demo at one of our upcoming shows! For additional details, see our events page.


Sign up to watch the recorded webinar:

How to Choose the Right AFM Probe

More than Just Roughness: AFM Techniques for Thin Film Analysis

Beyond Topography: New Advances in AFM Characterization of Polymers

Piezoresponse Force Microscopy: From Theory to Advanced Applications: Two-part Webinar Series


Oxford Instruments Asylum Research, Inc. • 6310 Hollister Ave. • Santa Barbara, CA  93117 •


Cypher Cypher