Asylum Research
 
 

Cypher S

Not sure where to start? See our product line overview brochure.

 

Current News

Data Sheets, Application Notes, Articles

AFM Tools for Nanoscale Electrical Characterization

AFM Characterization of Thin Films: High-Resolution Topography and Functional Properties

AFM Applications in Polymer Science and Engineering

Cypher ES Polymer Edition for polymer R&D research

 

Workshops, Talks and Tutorials

Contact us to schedule a live demo at one of our upcoming shows! For additional details, see our events page.

Webinars

Sign up to watch the recorded webinar: How to Choose the Right AFM Probe

More than Just Roughness: AFM Techniques for Thin Film Analysis

Beyond Topography: New Advances in AFM Characterization of Polymers

Piezoresponse Force Microscopy: From Theory to Advanced Applications: Two-part Webinar Series


 

Oxford Instruments Asylum Research, Inc. • 6310 Hollister Ave. • Santa Barbara, CA  93117 • +1-805-696-6466AFM.info@oxinst.com

 

Cypher Cypher