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Cypher S

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Current News

Data Sheets, Application Notes, Articles

Toward Better Charge Storage: AFM Determines Key EDL Properties in Future Ionic Liquid Electrolytes

AFM Characterization of Thin Films: High-Resolution Topography and Functional Properties

AFM Applications in Polymer Science and Engineering

 

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Oxford Instruments Asylum Research, Inc. • 6310 Hollister Ave. • Santa Barbara, CA  93117 • +1-805-696-6466AFM.info@oxinst.com

 

Cypher Cypher